8 results
Defect Analysis and Process Development of Microelectronics Devices Using Focused Ion Beam and Energy Filtering Transmission Electron Microscopy.
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 900-901
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- August 1999
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Thickness Measurement of Focused Ion Beam Thinned Silicon Crystals Using Convergent Beam.Electron Diffraction and Electron Energy Loss Spectroscopy.
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 898-899
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- August 1999
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Silicon Growth Rate Enhancement Using Trisilane in a Laser Direct-Writing Technique
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- Journal:
- MRS Online Proceedings Library Archive / Volume 397 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 595
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- 1995
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Chemical Vapor Deposition of Silicon Films by Pulsed CO2 Laser Irradiaton of Silane
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- Journal:
- MRS Online Proceedings Library Archive / Volume 29 / 1983
- Published online by Cambridge University Press:
- 21 February 2011, 41
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- 1983
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Explosive Crystallization in a-Ge and a-Si : A Review
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- Journal:
- MRS Online Proceedings Library Archive / Volume 13 / 1982
- Published online by Cambridge University Press:
- 15 February 2011, 165
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- 1982
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Explosive Recrystallization Of Ion Implantation Amorphous Silicon Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 13 / 1982
- Published online by Cambridge University Press:
- 15 February 2011, 177
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- 1982
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Uniform and Directed Crystallization of Deposited aSi on Glass Substrates at Linear Velocities Of 1 to 20 Meters Per Second
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- Journal:
- MRS Online Proceedings Library Archive / Volume 4 / 1981
- Published online by Cambridge University Press:
- 15 February 2011, 541
- Print publication:
- 1981
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Optical, Structural and Electrical Characteristics of Explosively Crystallized Si Thin Films on Glass Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 4 / 1981
- Published online by Cambridge University Press:
- 15 February 2011, 535
- Print publication:
- 1981
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