11 results
The Efficiency of in-situ Cleaning Methods for Minimizing Electron Beam Induced Contamination
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 818-819
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- July 2009
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Characterization of Electrodeposited Copper Films with Time-of-Flight SIMS
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 492-493
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- July 2009
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Secondary Electron Grain Contrast Induced by Incident Electrons in a Electroplated Copper Thin Film
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 672-673
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- July 2009
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Resolution and Contrast in Dual Beam Imaging of Three Dimensional Structures of Microelectronic Devices
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 178-179
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- August 2007
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New Measurements of Deconvoluted EDS Spectra of Elemental Standards as a Function of Atomic Number and Electron Beam Energy
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 830-831
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- August 2006
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Generation of Spurious X-rays by Focused Ion Beams in Dual Beam Instruments
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1250-1251
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- August 2006
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The Validation of Monte Carlo Methods for Scanning Electron Microscopy and Electron Microprobe Analysis
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1346-1347
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- August 2005
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Electron Probe Microanalysis of Cr Films on Semiconducting and Insulating Substrates
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 1308-1309
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- August 2005
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Electron microprobe analysis under conditions of non-normal Electron beam incidence
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 922-923
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- August 2000
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The Role of Monte Carlo Calculations In Quantitative Analysis
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 232-233
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- July 1998
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Quantitative Microprose Analysis with Energy Dispersive Detectors - A Status Report
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- Advances in X-ray Analysis / Volume 19 / 1975
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- 06 March 2019, pp. 113-152
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- 1975
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