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A history of high-power laser research and development in the United Kingdom
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- High Power Laser Science and Engineering / Volume 9 / 2021
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- 27 April 2021, e18
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Contributors
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- The Cambridge Dictionary of Philosophy
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- 05 August 2015
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- 27 April 2015, pp ix-xxx
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A comparison of the interaction, with two types of environment, of pure strains or strain crosses of poultry†
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- Genetical Research / Volume 4 / Issue 3 / November 1963
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- 14 April 2009, pp. 370-381
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The effect of sowing date and harvesting date on the yield of sugar beet
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- The Journal of Agricultural Science / Volume 75 / Issue 2 / October 1970
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- 27 March 2009, pp. 223-229
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Factors affecting the loss of yield of sugar beet caused by beet yellows virus: I. Rate and date of infection; date of sowing and harvesting
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- The Journal of Agricultural Science / Volume 36 / Issue 3 / July 1946
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- 27 March 2009, pp. 151-166
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Effects of soil compaction on yield and fertilizer requirement of sugar beet
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- The Journal of Agricultural Science / Volume 75 / Issue 3 / December 1970
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- 27 March 2009, pp. 533-537
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The effect of subsoiling and different levels of manuring on yields of cereals, lucerne and sugar beet
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- The Journal of Agricultural Science / Volume 69 / Issue 2 / October 1967
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- 27 March 2009, pp. 183-187
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InP Self Assembled Quantum Dot Lasers Grown on GaAs Substrates by Metalorganic Chemical Vapor Deposition
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- MRS Online Proceedings Library Archive / Volume 707 / 2001
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- 21 March 2011, H11.6.1
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- 2001
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InP Self Assembled Quantum Dot Lasers Grown on GaAs Substrates by Metalorganic Chemical Vapor Deposition
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- MRS Online Proceedings Library Archive / Volume 692 / 2001
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- 21 March 2011, H11.6.1
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- 2001
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New Transmission Electron Microscope Characterization Techniques from Precision Focused Ion Beam Membranes
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
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- 02 July 2020, pp. 886-887
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- August 1999
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Microtextural Characterization and Orientational Mapping of Polycrystalline Thin Films Using TEM Dark Field Imaging Through an Annular Objective Aperture
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
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- 02 July 2020, pp. 218-219
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- August 1999
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Growth and Structure of Metallic Barrie Laye and Interconnect Films I: Exeriments
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- MRS Online Proceedings Library Archive / Volume 564 / 1999
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- 10 February 2011, 307
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- 1999
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Growth and Structure of Metallic Barrier Layer and Interconnect Films I: Exeriments
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- MRS Online Proceedings Library Archive / Volume 562 / 1999
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- 10 February 2011, 263
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- 1999
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Applications of Ion Microscopy and In Situ Electron Microscopy to the Study of Electronic Materials and Devices
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- Microscopy and Microanalysis / Volume 4 / Issue 3 / June 1998
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- 28 July 2005, pp. 308-316
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- June 1998
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New Techniques for the Nanostructural Characterization of Semiconductor Materials and Devices Using Combined Focused Ion Beam and Transmission Electron Microscopy Techniques
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- MRS Online Proceedings Library Archive / Volume 523 / 1998
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- 10 February 2011, 141
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- 1998
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{111} Planar Faults in a Quenced and Annealed NiAl-0.3Hf Single Crystal Alloy
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
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- 02 July 2020, pp. 697-698
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- August 1997
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Microstructural Investigation of Strength Degradation in A Developmental Cvd Sic Fiber At 2000° C
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
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- 02 July 2020, pp. 743-744
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- August 1997
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Suppression of Boron Transient Enhanced Diffusion in SiGe HBTs by Carbon Incorporation
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- MRS Online Proceedings Library Archive / Volume 469 / 1997
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- 15 February 2011, 297
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- 1997
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A Study of Mixed Group-V Nitrides Grown by Gas-Source Molecular Beam Epitaxy Using a Nitrogen Radical Beam Source
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- MRS Online Proceedings Library Archive / Volume 449 / 1996
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- 10 February 2011, 203
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- 1996
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Service Limitations for Oxidation Resistant Intermetallic Compounds
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- MRS Online Proceedings Library Archive / Volume 364 / 1994
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- 22 February 2011, 1273
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- 1994
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