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Cerebral Ventricle Dimensions As Risk Factors for Schizophrenia and Affective Psychosis: An Epidemiological Approach To Analysis
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- Journal:
- European Psychiatry / Volume 11 / Issue S4 / 1996
- Published online by Cambridge University Press:
- 16 April 2020, p. 233s
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Luminescence Properties of Thin-Film SrS:Cu Phosphors for Electroluminescent Displays
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- Journal:
- MRS Online Proceedings Library Archive / Volume 508 / January 1998
- Published online by Cambridge University Press:
- 10 February 2011, 281
- Print publication:
- January 1998
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Evolution of the Electrical Properties of Interconnects Under Electromigration Stress
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- Journal:
- MRS Online Proceedings Library Archive / Volume 516 / January 1998
- Published online by Cambridge University Press:
- 10 February 2011, 9
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- January 1998
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Microstructure, Damage and Resistance during Electromigration Life-Testing of Al-Cu Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 309 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 369
- Print publication:
- 1993
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