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Combining a Nanoprobing Setup with PFIB Sample Deprocessing
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 874-875
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- August 2019
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The NanoWorkstation: Complementing FIB-SEM Tools with Micromanipulators
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 846-847
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- August 2018
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In Situ Nanoprobing Tools for Fault Localization and Defect Characterization
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1432-1433
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- July 2017
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Electrical Probing and Current Imaging for Failure Analysis in the SEM/FIB
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 169-170
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- August 2015
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Towards the Understanding of Resistive Contrast Imaging in in-situ Dielectric Breakdown Studies Using a Nanoprober Setup
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1249 / 2010
- Published online by Cambridge University Press:
- 01 February 2011, 1249-F08-14
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- 2010
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