Research Article
Crystal structure determination of molecular compounds from conventional powder diffraction data: Trimeric silver(I) 3,5-dimethylpyrazolate
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- 10 January 2013, pp. 35-40
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Ab initio determination and Rietveld refinement of the crystal structure of Ba7Cl2F12
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- 10 January 2013, pp. 152-156
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Crystallographic study of the mineral ferroan clinozoisite from three localities of Northern Greece
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- 10 January 2013, pp. 222-226
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High-resolution X-ray diffraction study of the chromite (Mg0.60Fe0.402+)(Al0.39Cr1.50Fe0.093+)O4
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- 10 January 2013, pp. 96-99
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Powder X-ray diffraction data for Ba12Cl5F19
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- 10 January 2013, pp. 157-158
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An experimental investigation of the effects of axial divergence on diffraction line profiles
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- 10 January 2013, pp. 100-106
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Powder diffraction study of arsenic-substituted nasicon structures MeZr2As(3−x)PxO12 (Me=Na+, K+)
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- 10 January 2013, pp. 227-231
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X-ray powder diffraction analysis of a nonlinear optical material 1-benzoyl-3-(4-benzyl)thiourea [N-benzoyl-N′-(4-benzyl)thiourea]
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- 10 January 2013, pp. 41-43
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Crystal structures and reference X-ray powder diffraction patterns of Sr4−xCaxPb2O8 (x=1,2,3)
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- 10 January 2013, pp. 232-240
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Powder diffraction refinement of the Co2Al5 structure
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- 10 January 2013, pp. 159-162
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Crystal data for Cu2Th4(MoO4)9 and isostructural compounds
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- 10 January 2013, pp. 107-112
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Rietveld refinement of chapmanite SbFe2Si2O8OH, a TO dioctahedral kaolinite-like mineral
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- 10 January 2013, pp. 44-49
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X-ray powder diffraction data for bulk Zn1−xMgxSe crystals
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- 10 January 2013, pp. 50-55
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X-ray powder diffraction data and structure refinement of CeFeGe3
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- 10 January 2013, pp. 241-243
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Powder diffraction data for fluorocomplexes of niobium IV: MNbF6 (M=Ca, Mg, Cd, Zn)
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- 10 January 2013, pp. 163-165
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Crystal structure refinement of the ferroelectric ceramic compound Sm2Bi2Ti3O12
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- 10 January 2013, pp. 113-115
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Crystal and powder neutron diffraction data of Tl3Li(MO4)2 (M=Mo, W)
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- 10 January 2013, pp. 244-245
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International Report
Calendar of Meetings
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- 10 January 2013, pp. 56-60
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Research Article
Use of Compton scattering measurements for attenuation corrections in Rietveld phase analysis with an external standard
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- 10 January 2013, pp. 166-170
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International Report
Regional Report
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- 10 January 2013, p. 116
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