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This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
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Spatially transient stress effects in thin films by X-ray diffraction
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- Published online by Cambridge University Press:
- 01 March 2012, pp. 112-116
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PC-Based Management and Analysis of X-Ray Residual Stress Data
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- Published online by Cambridge University Press:
- 06 March 2019, pp. 535-541
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X-ray powder diffraction characterization of Bi14(Sr,Ca)12O33 solid solutions
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- Published online by Cambridge University Press:
- 10 January 2013, pp. 268-275
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X-ray powder diffraction data and thermal stability of a new high temperature phase of NaBi3V2O10
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- 01 March 2012, pp. 51-57
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X-Ray Diffraction Using Synchrotron Radiation - A Catalysis Perspective
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- 06 March 2019, pp. 9-20
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100 Years Since Albert W. Hull's Contributions to Powder Diffraction
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- 23 February 2017, p. 1
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Crystal structure of bretylium tosylate (Bretylol®), C18H24BrNO3S
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- 20 September 2018, pp. 298-302
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Novel GIX2 Apparatus for Thin Film Analysis Using Color Laue Method
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- 06 March 2019, pp. 171-180
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Proposed Methods for Depth Profiling of Residual Stresses using Beam-Limiting Masks
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- 06 March 2019, pp. 247-255
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Single-crystal structure analysis of designer drugs circulating in the Japanese drug market by the synchrotron radiation X-ray diffraction
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- 20 June 2017, pp. 112-117
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X-Ray Stress Measurements in Ground Surface of Steel by Position Sensitive Detector
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- 06 March 2019, pp. 181-185
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Synthesis and X-ray powder diffraction data of N-benzyl-6-chloro-4-(4-methoxyphenyl)-3-methyl-1,2,3,4-tetrahydroquinoline
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- Published online by Cambridge University Press:
- 30 November 2012, pp. 269-272
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Quasi-Fundamental Correction Methods Using Broadband X-Ray Excitation
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- 06 March 2019, pp. 293-302
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X -Ray Topography of Ion - Implanted Laser -Annealed Si
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- 06 March 2019, pp. 381-386
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Crystal structure of pantoprazole sodium sesquihydrate Form I, C16H14F2N3O4SNa(H2O)1.5
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- 20 January 2020, pp. 53-60
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Oscillations in Interplanar Spacing Vs. sin2ψ a FEM Analysis
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- 06 March 2019, pp. 191-204
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A FORTRAN Program for Conversion of PC-APD Data Files into ASCII Files
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- 10 January 2013, p. 179
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Some Observations on the Use of Certain Analyzing Crystals for the Determination of Silicon and Aluminum*
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- 06 March 2019, pp. 515-527
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X-ray powder diffraction data for the mineral refikite
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- 17 August 2012, pp. 215-216
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Powder Diffraction Data of Four Complex Cesium Thiocyanates: Cs3A[B2(SCN)7], with A = Sr, Ba and B = Ag, Cu
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- 10 January 2013, pp. 111-113
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