An overview of the techniques used in art and archaeology is presented and the applicability of X-ray radiography, X-ray fluorescence (XRF), and X-ray diffraction analysis (XRD) as a tool for nondestructive investigations of objects of art and archaeology is discussed. X-ray radiography, for example, is a standard technique widely used and accepted by art historians, archaeologists, curators, and conservators as this method enables information about the manufacturing process and the condition of an object without “touching” the artifact. XRF and XRD enable a nondestructive determination of the material composition of artifacts and the determination of the crystalline structure of the components too. Air path systems and instruments with the micro-beam of X-ray and synchrotron radiation were applied for the analysis of easel paintings, pigments in paint layers, glass artifacts, and coins.

Synchrotron X rays were used to perform nondestructive transmission diffraction and fluorescence experiments on a group of 24 European and Islamic astrolabes dated between 1350–1720 A.D. in order to determine their compositions. A group of six astrolabes produced in Lahore between 1601–1662 A.D. were found to contain a mixed α+β brass microstructure, proving that the brass was produced by a comelting technique rather than the traditional cementation process. The results also show evidence of dezincification, attributed to heavy annealing of the brass during astrolabe manufacture. This effect was so severe that an accurate analysis of the bulk Zn composition could not be determined from the fluorescence results alone; transmission X-ray diffraction gives a more accurate measurement of the bulk Zn composition.

XRF is generally considered a nondestructive analytical method in the sense that a specimen is not altered by the analytical procedure. This study is related to paintings and illuminated manuscripts, where the analytes are often inorganic pigments embedded into organic matrices such as fabrics (canvases), paper or parchment, binders, and varnish. We found that a typical measurement cycle with conventional tubes and energy dispersive systems (e.g., 100 s, 100 W tube-power) causes no visible harm. However, 3 kW radiative power for several minutes and more (as often required for wide angle scans as well as for the analysis of light elements or traces in a wavelength dispersive spectrometer) can leave visible traces of permanent yellowing, brittleness, and even mechanical decomposition. In such cases scanning electron microscopy-images indicate permanent alteration of the cellulose fibers and, in paper, of the binder. Employment of modern X-ray optical devices which focus the photons of a wide beam onto a small spot may also leave visible (and invisible) traces of destruction.

Release 2003 of the Powder Diffraction File (PDF) contains ∼280 000 unique entries organized in a series of tables in a relational database format. The PDF is available in two products, PDF-4/Full File and PDF-4/Organics, which allow users to access and query over 150 million filled entry fields. An editorial database is used to generate the commercial products that contain tables of experimental details and statistical evaluation criteria used by the editors to evaluate quality and determine quality marks for each entry in the PDF. This editorial database has nearly doubled the searchable entry fields. This database was mined to evaluate experimental methods in X-ray diffraction. Both experimental powder diffraction data and data calculated from predominantly single crystal X-ray structural analyses were assigned statistical quality criteria. For experimental powder data, the average delta two theta values for all d-spacings in the entry set were used. Calculated data were evaluated using R factor values as the primary quality criteria. A Quality Index, which measures the errors in refined unit cell parameters divided by the magnitude of the cell parameter, can be used to compare all types of data. Experimental variables were then analyzed versus these criteria. Variables include optic configuration, (i.e., Seeman–Bohlin, Guinier, Debye–Scherrer), use of internal and external standards, use of monochromators, wavelength divergence, wavelength selection, equipment radius, specimen transparency, and specimen absorption. This study significantly differs from prior round robin analyses in that the use of the database allows us to study very large population sets for every variable analyzed.

In an attempt to fill a gap between fully automatic search/match programs and purely manual methods based on paper products, a relational database plug-in has been developed that functions as a PC-based Search/Index program for extracting information from PDF-4 powder diffraction databases. The plug-in provides an adjustable search window and match window to account for experimental errors. Both Hanawalt and Fink search methods are incorporated. In this paper, we report search-indexing results obtained with the new PDF-4 plug-in applied to a new relational database, the PDF-4/Organics 2003. This database has 24 385 experimental entries and 122 816 calculated patterns derived from the Cambridge Crystallographic Database. We introduce a goodness of match (GOM) parameter to describe the relative agreement between the experimental input data and selected reference patterns from the PDF-4/Organics 2003. The relevance of the GOM is illustrated in several example problems. Multiphase samples can be treated on a phase-by-phase basis.

An instrument for the simultaneous measurement of X-ray powder diffraction (XRD) data and differential scanning calorimetry (DSC) data under a controlled humidity condition has been developed in order to achieve a design concept of reliable and simple in operation. Examples of the application to studies on hydration, dehydration, and rehydration processes of pharmaceutical compounds under various humidity conditions are presented. The usefulness of the present XRD-DSC system will be demonstrated.

X-ray powder diffraction (XRD) is utilized for the determination of polymorphism in crystalline organic materials. Though convenient to use in a laboratory setting, XRD is not easily adapted to in situ monitoring of synthetic chemical production applications or thin film depositions. Near-infrared spectroscopy (NIR) can be adapted to in situ manufacturing schemes by use of a source/detector probe. Conversely, NIR is unable to conclusively define the existence of polymorphism in crystalline materials. By combining the two techniques, a novel simultaneous NIR/XRD instrument has been developed. During material’s analysis, results from XRD allowed for the determination of the existence of polymorphic phases, and NIR data were collected as a fingerprint for each of the observed polymorphs. These NIR fingerprints allowed for the development of a library, which can be referenced during the use of a NIR probe in manufacturing settings. The NIR/XRD instrument was also used to monitor materials during exposure to ambient air. XRD can detect crystalline phase changes and NIR can monitor solvent loss and/or water uptake.

The Rietveld method allows a precise quantitative phase analysis of building materials. Thanks to the development of stable-functioning software and the use of high-performance detectors, a quantitative phase analysis by X-ray, including sample preparation, and measurement and evaluation, can be performed in fewer than ten minutes. This has made it possible to integrate the method into existing laboratory automation systems for process and quality control to provide a means of online monitoring. Due to the completely automated operating principle of the Rietveld software, no additional staff is required and the results are user-independent. The Rietveld method is now being employed in industrial laboratories and also in various cement plants owned by the Lafarge Group as the standard method of quantitative analysis of Portland Cement clinkers and Portland Cements (CEM I, CEM II A-L).

The laboratory implementation of grazing incidence in-plane X-ray diffraction, using an unmodified commercial diffractometer, is described. Low resolution, high intensity measurements are illustrated in the study of the in-plane lattice parameters and texture of a thin polycrystalline ZnO film on glass, the in-plane order in Cd arachidate Langmuir–Blodgett films, and the depth dependence of the lattice parameter in graded Si–Ge epilayers. Use of an asymmetrically cut Ge crystal to compress and monochromate the beam provides a high resolution setting, appropriate to measurement of the in-plane mosaic of mismatched epilayers such as GaN on sapphire.

This study is about the structural properties of SiGe and SiGe:C heteroepitaxial layers on Si (001). The structural characterization is based on the application of complementary information content of X-ray scattering techniques like high-resolution X-ray diffraction (XRD), X-ray reflectivity (XRR), and X-ray diffuse scattering (XDS). One main focus of the analysis is to derive a sample model that sufficiently describes all experimental datasets. In addition, the reliability of parameters extracted by just one single method is discussed. It turned out that XRR is more sensitive to the near surface region, indicating the presence of surface roughness and density gradients that do not significantly affect the XRD pattern.

Local layer structures and their formation process in a half-V-shaped switching ferroelectric liquid crystal (HV-FLC) were investigated by means of synchrotron X-ray microdiffraction. The HV-FLC is a FLC that has a cholesteric–chiral smectic C (Ch–SmC*) phase transition sequences. X-ray microdiffraction measurements revealed that the SmC* phase in the HV-FLC was composed of asymmetric chevron and inclined-bookshelf structures. In addition, temperature-controlled X-ray diffraction measurements showed that the transient layer structures appeared during the Ch to SmC* phase transition.

The local variation in strain and rotation of the Si substrate due to overlying Ni thin film features has been observed using X-ray microdiffraction. Residual tensile stress in 1 μm thick, 190 μm diameter Ni dots of 990 MPa imparted an average compressive stress in the underlying Si substrate. Ni Kα fluorescence scans, acquired simultaneously with Si (333) diffraction data, allow for a precise determination of the Ni feature edge location relative to the observed shift in Si (333) peak position. Rocking curve mesh scans, in which the sample was translated perpendicular and parallel to the diffraction plane, were used to deconvolute the effects of substrate strain due to d-spacing shifts and rotation of the local Si surface. In addition, shear strains at the dot edge imparted a significant shift in the Si (333) diffraction peak, producing a secondary diffraction peak in modified reciprocal space scans.

Diffraction of high-energy synchrotron radiation with wavelengths in the range of 0.1 Å, provided by the beamline BW5 at HASYLAB in Hamburg, was used to measure textures (orientation distribution) and microstructures (spatial distribution) of the crystallites in various polycrystalline materials. In order to achieve extremely high angular-combined with very high lateral resolution a continuous sweeping technique with an area detector was employed. This technique “images” three different types of two-dimensional sections and projections of the six-dimensional orientation–location space onto the area detector. In many cases the orientations and locations of all individual grains of the sample can thus be seen simultaneously. The high penetration depth of this radiation in the range of several centimeters (comparable with that of neutrons) allows investigating big or capsulated samples. Examples are given of grain-resolved recrystallization textures, a soldering seam, a filled beverage can, and the orientation distribution of kamacite lamellae in an iron meteorite, elucidating the orientation relationship of the γ→α transformation in iron.

In this paper we describe the capabilities for texture measurements of the new neutron time-of-flight diffractometer HIPPO at the Los Alamos Neutron Science Center. The orientation distribution function (ODF) is extracted from multiple neutron time-of-flight histograms using the full-pattern analysis first described by Rietveld. Both, the well-established description of the ODF using spherical harmonics functions and the WIMV method, more recently introduced for the analysis of time-of-flight data, are available to routinely derive the ODF from HIPPO data. At ambient conditions, total count time of less than one hour is ample to collect sufficient data for texture analysis in most cases. The large sample throughput for texture measurements at ambient conditions possible with HIPPO requires a robust and reliable, semi-automated data analysis. HIPPO’s unique capabilities to measure large quantities of ambient condition samples and to measure texture at temperature and uni-axial stress are described. Examples for all types of texture measurements are given

Stress in the early stages of growth has been measured in α-Al2O3 (alumina) scales formed on FeCrAl- and NiAl-based alloys during heating in air at 1000 °C to 1200 °C. Scale thickness ranges from 0.5 to 5 μm, times from 5 to 720 min. Stress was measured using the multiple-tilt method. In order to measure the thinnest scales at the earliest times, focused, monochromatic synchrotron radiation was used for high intensity, and a fixed, small angle of incidence was used along with an appropriate wavelength to maximize scattering from the film relative to the background from the substrate. Depending on the composition, transient tensile stresses of up to 1.2 GPa were observed, with maximum stress at times ranging from >10 h at 1000 °C to <10 min at 1200 °C. Thermal stresses induced by an abrupt temperature change were found to relax much more quickly, suggesting that the kinetics observed during isothermal growth reflect a dynamic competition between stress generation and stress relaxation. These results challenge commonly accepted models of growth stress in scales that predict that a compressive stress will be generated as the metal converts to a larger-volume oxide in a constrained location such as an interface. The observed tensile stress may be due to another mechanism altogether (e.g., grain coalescence), or to the conversion of a transitional Al2O3 to the equilibrium α-Al2O3 phase. For one composition, transitional Al2O3 is observed during the period of tensile stress

Elevated-temperature X-ray diffraction (XRD) was used to evaluate residual stresses in aluminum thin films on Si(100). The films with a thickness of 2 μm were deposited by magnetron sputtering at different temperatures, and XRD measurements were carried out with the heating stage DHS 900 mounted on a Seifert 3000 PTS diffractometer. The strains were characterized always in temperature cycles from room temperature up to 450 °C with steps of 50 °C. Stress values in weakly textured thin films were calculated using the Hill model, applying temperature-dependent X-ray elastic constants of aluminum. The thin films exhibit specific temperature hysteresis of stresses depending on the deposition temperature (being from the range of 50 °C–300 °C). The results allow us to quantify contributions of intrinsic and extrinsic stresses to the total stress in the layers as well as to evaluate phenomena related to plastic yield. The comparison of the data from thin films deposited at different temperatures indicate a dependence of intrinsic stresses on the substrate temperature during deposition as well as the presence of the plastic yield in films during the cool-down after deposition

The X-ray fluorescence holography (XFH) method has drawn the attention of many researchers as a novel experimental technique for imaging a three-dimensional local atomic structure around a certain element in a single crystal. Synchrotron radiation (SR) has been mainly used for the measurements because of extremely weak signals that are about 0.3% of isotropic fluorescent radiation. The measurements limited to the use of a SR source clearly hinder from increasing the number of the users. Thus, we developed a laboratory XFH equipment with a conventional X-ray source by using a singly bent graphite monochromator with a large curvature and X-ray detector for a high counting rate. With this equipment, we have successfully demonstrated that high-quality hologram data of a gold single crystal almost equivalent to those with a SR source are obtained. Four different holograms are recorded in the normal and inverse XFH modes. An atomic image reconstructed from these holograms patterns shows a distinct atomic image of Au

Total reflection X-ray fluorescence analysis (TXRF) using monochromatized undulator radiation in the PTB radiometry laboratory at the synchrotron radiation facility BESSY II has been employed to investigate the chemical state of nitrogen compounds in aerosols. The aerosol samples of different size fractions were deposited on silicon wafer surfaces in a May impactor. Using a thin window Si(Li) detector, TXRF detection limits for nitrogen are in the upper fg and lower pg range. Taking advantage of the tunability of monochromatized undulator radiation, the near edge X-ray absorption fine structure (NEXAFS) could be combined with TXRF analysis, allowing for the speciation of the aerosols at the nitrogen K absorption edge. Such low detection limits enable an analysis of aerosol samples taken in 10 min with acceptable accuracy. Applicability of the technique to real aerosol samples has been used to compare nitrogen oxidation state in suburban and rural aerosols