Research Article
Reconstructed Structure of SiO2/Si(111) Interface
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- Published online by Cambridge University Press:
- 21 February 2011, 309
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Double Axis X-Ray Diffractometry Analysis of the Homoepitaxial Interface Between Substrate and Buffer Layer
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- Published online by Cambridge University Press:
- 21 February 2011, 315
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Characterization of GaAs/Si Interface Structure by X-Ray Diffraction
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- Published online by Cambridge University Press:
- 21 February 2011, 321
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X-Ray Reflectometry of Single- and Multi-Layer Thin Films
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- Published online by Cambridge University Press:
- 21 February 2011, 327
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X-Ray Reflectivity Study of Single- and Bicrystals of Gold
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- 21 February 2011, 339
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X-Ray Reflectometry from Semiconductor Surfaces and Interfaces
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- 21 February 2011, 345
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X-Ray Reflectivity Measurements of Surface Roughness Using Energy Dispersive Detection
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- Published online by Cambridge University Press:
- 21 February 2011, 351
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Substrate Dependent Texture and Heteroepitaxy for Group IIIA Nitride Films by the X-Ray Precession Method
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- Published online by Cambridge University Press:
- 21 February 2011, 357
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