Olympus Soft Imaging Solutions (OSIS) provides a decidedly simple answer to the often very diverse requirements in the fields of TEM and SEM applications: dedicated system solutions. This innovative approach helps the users to focus on the essentials—images and results.

Following is a list of microscopy related meetings and courses. The editors would greatly appreciate input to this list via the electronic submission form under “events/other microscopy events” at the MSA webpage: www.microscopy.org. We will gladly add hypertext links to the notice on the web and insert a listing of the meeting in the next issue.

Selected postings from the Microscopy Listserver from March 1, 2013 to April 30, 2013. Complete listings and subscription information can be obtained at http://www.microscopy.com. Postings may have been edited to conserve space or for clarity.

I am having trouble with my light microscopes. I keep seeing double even when I correctly adjust the interpupillary distance and dioptric parameters. Is it me, or could something serious be wrong with the scope?

Selected postings from the Microscopy Listserver from May 1, 2013 to June 30, 2013. Complete listings and subscription information can be obtained at http://www.microscopy.com. Postings may have been edited to conserve space or for clarity.

Selected postings from the Microscopy Listserver from January 1, 2012 to February 28, 2012. Complete listings and subscription information can be obtained at http://www.microscopy.com. Postings may have been edited to conserve space or for clarity.

Selected postings from the Microscopy Listserver from November 1, 2012 to December 31, 2012. Complete listings and subscription information can be obtained at http://www.microscopy.com. Postings may have been edited to conserve space or for clarity.

Selected postings from the Microscopy Listserver from September 1, 2012 to October 31, 2012. Complete listings and subscription information can be obtained at http://www.microscopy.com. Postings may have been edited to conserve space or for clarity.

For a beam-sensitive specimen, the spatial resolution of TEM analysis is limited by radiation damage, and it is obviously a good thing to minimize the amount of damage that occurs during a measurement. Knock-on displacement damage, which predominates in metals, can be reduced by lowering the accelerating voltage (ideally below a threshold value that depends on atomic weight and displacement energy). Ionization damage (radiolysis), which predominates in organic materials, is often ameliorated if the specimen is cooled below room temperature.

Following is a list of microscopy related meetings and courses. The editors would greatly appreciate input to this list via the electronic submission form under “events/other microscopy events” at the MSA webpage: www.microscopy.org. We will gladly add hypertext links to the notice on the web and insert a listing of the meeting in the next issue.

Following is a list of microscopy related meetings and courses. The editors would greatly appreciate input to this list via the electronic submission form under “events/other microscopy events” at the MSA webpage: www.microscopy.org. We will gladly add hypertext links to the notice on the web and insert a listing of the meeting in the next issue.

Following is a list of microscopy related meetings and courses. The editors would greatly appreciate input to this list via the electronic submission form under “events/other microscopy events” at the MSA webpage: www.microscopy.org. We will gladly add hypertext links to the notice on the web and insert a listing of the meeting in the next issue.

I know this question gets asked over and over, but I am determined that there must be a basis for choosing either side of a TEM grid when picking up sections. Which side works best and why—the dull side or the shiny side? By the way, I love you and simply must meet you to share my micrographs. Is there a time when we could get together?