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Volume 22 - March 2014

Contents

Page 2 of 6

Feature Article

  • Color Integrity: Is What You See What You Saw?

  • Barbara Foster, Jerry Sedgewick
  • Published online by Cambridge University Press:
    21 January 2014, pp. 12-17
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X-Ray Microscopy

  • X-Ray Microscopy for Hierarchical Multi-Scale Materials

  • Leah L. Lavery, Jeff Gelb, Arno P. Merkle, Andy Steinbach
  • Published online by Cambridge University Press:
    13 May 2014, pp. 16-21
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Light Microscopy

  • Preparing Monochromatic Images for Publication: Theoretical Considerations and Practical Implications

  • Jörg Piper
  • Published online by Cambridge University Press:
    21 January 2014, pp. 18-25
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  • Living Images from the Birth of Microscopy

  • Brian J. Ford
  • Published online by Cambridge University Press:
    25 July 2014, pp. 18-23
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Company Profile

  • Electron Microscopy Sciences

  • Published online by Cambridge University Press:
    11 March 2014, p. 5
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  • Since our beginning close to 30 years ago, Electron Microscopy Sciences has been specializing in the manufacturing, preparation, and distribution of only the highest quality chemicals, supplies, and equipment, for microscopy and histology as well as all of its related fields.

Microanalysis

  • Advanced Materials Characterization with Full-Spectrum Phase Mapping

  • Tara Nylese, Robert Anderhalt
  • Published online by Cambridge University Press:
    11 March 2014, pp. 18-23
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Biological Applications

  • Death Under Glass: An Exhibition Highlighting Forensic Histology

  • Marianne Hamel, Nikki Johnson
  • Published online by Cambridge University Press:
    29 August 2014, pp. 20-25
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Scanning Probe Microscopy

  • Automated AFM Boosts Throughput in Automatic Defect Review

  • Ryan YK Yoo
  • Published online by Cambridge University Press:
    07 November 2014, pp. 18-23
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  • Tiny Crystals Located and Identified by Infrared Nanoscopy

  • Clemens Liewald, Fritz Keilmann
  • Published online by Cambridge University Press:
    07 November 2014, pp. 24-29
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Light Microscopy

  • An Inexpensive Fluorescent Graticule

  • Safraz Khan, Joshua C. Brumberg
  • Published online by Cambridge University Press:
    21 January 2014, pp. 26-27
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Company Profile

  • Hitachi High Technologies America, Inc.

  • Published online by Cambridge University Press:
    11 March 2014, p. 6
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  • The Nanotechnology Systems Division (NSD) of Hitachi High Technologies America, Inc. (HTA) provides technologically advanced solutions to meet the diverse and complex challenges of materials science, biological research, and industrial manufacturing. We support our satisfied customers with a wide range of reliability-proven instrumentation, including scanning electron microscopy (SEM), analytical and biological transmission electron microscopy (TEM), dedicated STEM, focused ion beam (FIB), tabletop SEM, and microanalysis sample preparation systems.

Biological Applications

  • Keeping Up Electron Microscopy Diagnostic Skills in a PCR World

  • Craig Radi
  • Published online by Cambridge University Press:
    29 August 2014, pp. 26-29
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Materials Applications

Light Microscopy

  • Optical Tweezers for Quantitative Force Measurements and Live Cell Experiments

  • Philipp Rauch, Torsten Jähnke
  • Published online by Cambridge University Press:
    25 July 2014, pp. 24-31
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Microanalysis

  • High Spatial Resolution X-Ray Analysis in a SEM

  • Steve Chapman, Ron Rasch
  • Published online by Cambridge University Press:
    11 March 2014, pp. 24-27
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Company Profile

  • Leica Microsystems

  • Published online by Cambridge University Press:
    11 March 2014, p. 7
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  • Leica Microsystems is a world leader in microscopes and scientific instruments. Founded as a family business in the nineteenth century, the company's history was marked by unparalleled innovation on its way to becoming a global enterprise. Its historically close cooperation with the scientific community is the key to Leica Microsystems' tradition of innovation, which draws on users' ideas and creates solutions tailored to their requirements.

Materials Applications

  • Dual-Lens Electron Holography for Junction Profiling and Strain Mapping of Semiconductor Devices

  • Y.Y. Wang, A. Domenicucci, J. Bruley
  • Published online by Cambridge University Press:
    13 May 2014, pp. 28-35
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Microanalysis

Instrumentation

  • The Dual-Beam—Its Birth, Progress, and Future

  • John Williams
  • Published online by Cambridge University Press:
    25 July 2014, pp. 32-37
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Page 2 of 6