“Extreme high-resolution” (XHR) scanning electron microscopy (SEM) has the potential to change the way we look at SEM. Anyone in the SEM world knows that you don't do high-resolution SEM at low accelerating voltages because of chromatic aberration limitations. The XHR design offers a new way to deal with chromatic aberration and realize the huge benefit of reduced beam penetration.

The new Magellan 400 SEM family is the first to offer subnanometer resolution over the entire electron energy range from 1 keV to 30 keV, effectively establishing a new performance category known as XHR SEM (Figure 1). To achieve this unprecedented performance, the Magellan combines novel electron optical design elements with technologies developed for the industry-leading Titan (scanning) transmission electron microscope (S/TEM) and DualBeam (focused ion /SEM) platforms.

Fluorescence microscopy techniques are now prevalent throughout the life sciences and many of the physical sciences. These techniques are often dependent on white light sources that have evolved from the more traditional mercury arc lamp to metal halide sources to the more recent light emitting diodes (LEDs). The newer light sources show more uniform power across the visible light spectrum, allowing for the use of fluorophores and fluorescent proteins outside of the peak wavelengths associated with the more traditional light sources.

Color has historically seen limited use in metallography, mainly due to the cost of film and prints and the difficulty and cost of reproducing images in publications. However, with the growth of digital imaging, capturing color images is much simpler and cheaper. Also, printing images in color is inexpensive for in-house reports, and can be distributed cheaply on CDs, although reproduction in journals is still expensive. Color does have many advantages over black and white. First, the human eye is sensitive to only about forty shades of gray from white to black, but is sensitive to a vast number of colors. Tint etchants reveal features in the microstructure that often cannot be revealed using standard black and white etchants.

With the recent success of the human genome project, researchers must now discover biological functions of the tens of thousands of proteins encoded in the genome. Molecular cell biology and structural biology methods are required for this work.

Modern multidimensional bioimaging methods, such as laser scanning confocal microscopy and other light microscopic techniques, have emerged as a major research methodology in this new era of informational biology. These methods all produce vast amounts of digital information and require specialized computer software to process and analyze it. Several programs intended for this purpose have become available in recent years, but microscopists around the world frequently discover them unsuitable for many of their required tasks. The reasons for this are varied, and include: extensive bugs that take too long to fix, prohibitively high prices (also for updates and bug fixes), algorithms that are undisclosed and as such unacceptable for accurate scientific work, limited sets of features dispersed into separate “modules”, complex and difficult user interfaces, and lack of flexibility in adapting to specific research situations.

Charged particle microscopes have been used extensively for the creation of nanostructures. As a subset of the techniques for this, the process of beam-induced chemistry offers almost endless flexibility for both additive (by beam-driven precursor deposition) and subtractive (by beam-catalyzed etching) processing. A recent review article makes it evident simply by its massive page count the number of materials that have been used to deposit a variety of conductive, insulating, magnetic, photonic, and other structures. To take advantage of these capabilities, though, the nanoarchitect must select the correct settings for a large number of parameters. One key figure of interest is the size of features that can be written by deposition of conducting material: how small can we go? Process development is complex, however: a standard beam-induced deposition process using the system described below calls for the control of sixteen different parameters! Several of these are used to set the flow of the reactant, several are required for defining the particle beam, and yet another set of parameters call out the routine by which the beam is scanned over the pattern of interest. In the end, the result provides just one recipe for one chemistry with one beam type. The wide scatter of reported outcomes in the review article mentioned above indicates the complexity of the problem, where each result given can be considered just a snapshot of one small corner of the parameter space. Our goal here is to apply a quantitative optimization methodology for the determination of beam chemistry processes in the helium ion microscope (HIM). In this article, we discuss efforts toward finding the minimum obtainable line width and gap width between line pairs of deposited platinum lines and giving a predictive formulation of the same.

Gunshot residue (GSR) is typically found on the hands or clothing of persons who have been in the environment of a discharging firearm, but it may also be found on objects in the vicinity of the discharge. Computer-controlled scanning electron microscopy (CCSEM) is the method preferred by the forensic community for the automated analysis of GSR. GSR samples are therefore typically collected from a crime suspect's hands and/or clothing using SEM sample stubs coated with a conductive adhesive. The three major components in modern firearm cartridge primers are lead styphanate (initiator), antimony sulfide (fuel), and barium nitrate (oxidizer). GSR consists of the products of combustion of these primer materials. Large populations of particles in the size range of ~1–10 μm are rapidly screened by energy-dispersive X-ray spectroscopy (EDS) for the presence of combinations of Pb, Sb, and Ba. When combinations of these three elements are detected, the particles are flagged as potential GSR particulate. Flagged particles with significant Pb/Sb/Ba compositions are subsequently relocated for a live identification and a positive confirmation of GSR. Positive particles are classified as being either “characteristic of GSR” (that is, all three key elements are present) or “consistent with GSR” (that is, any two of the key elements are present) based on the particle composition and morphology. Classification is based on the presence of the constituent elements and is not dependant on the element amounts. If a particle does not meet the proper compositional or morphological criteria, it is rejected as GSR. However, CCSEM generally does not provide information regarding the population of particles much less than 1 μm or the surface chemistry of the GSR particles. This article examines the fine fraction of GSR particles with high-resolution electron microscopy and complements the microscopy data with surface chemistry information from X-ray photoelectron spectroscopy (XPS).

Scanning probe microscopy (SPM) techniques have become a mainstay of nanoscience and nanotechnology by providing easy-to-use, gentle, structural imaging and manipulation on nanometer length scales. Beyond topographic imaging, SPMs have an extremely broad range of applications in probing electrical, magnetic, and mechanical properties. Despite impressive growth in applications, the traditional approach to SPM measurements—based on detection of cantilever response to a well-defined periodic excitation at a single frequency—has remained virtually identical for almost twenty years.

Since the creation of the Joint Committee on Powder Diffraction Standards (JCPDS) over sixty years ago, the Powder Diffraction File (PDF) has been the key source of standard powder diffraction data for identification and analysis of materials of all types, from natural minerals and high-tech ceramics to metals and alloys and pharmaceuticals. Although this editorially reviewed database has been the mainstay for diffraction pattern reference for the x-ray powder diffraction community, recent developments provide information and tools for electron diffraction. In recent years, the International Centre for Diffraction Data (ICDD, formerly JCPDS) has transformed the flat-file format of the PDF to a more flexible relational database (RDB) format. The PDF has been greatly expanded to include calculated patterns from multiple collaborating databases, including the Inorganic Crystal Structure Database (FIZ Karlsruhe, Germany), the Linus Pauling File (MPDS, Vitznau, Switzerland), and the Cambridge Structural Database (CCDC, Cambridge, United Kingdom). A significant portion of its entries include atomic coordinates and a specific database dedicated to organic phases exists. All new entries for the ICDD databases undergo over 100 quality checks before inclusion, and a quality mark is assigned for each entry that passes.

Historically, most SEM operators used accelerating voltages that were fairly high, quite often in the range of 15–20 kV. Now progress in electron optics has made low-voltage observations a routine mode of SEM operation. The greatly improved range of utilized accelerating voltages provides the SEM operator with additional flexibility and with additional responsibilities for choosing the right SEM settings for image acquisition.

Up to now, researchers performing analytical investigations in the transmission electron microscope typically had to choose between analytical spectroscopy techniques. They might choose energy dispersive X-ray spectroscopy (EDS) analysis when working with thick samples containing high-Z elements or choose electron energy-loss spectroscopy (EELS) when studying low-Z materials in thin samples. With the advent of STEM instruments possessing both high-mechanical stability and high-brightness probes, coupled with the latest generation of fast, efficient X-ray and EELS detectors, choosing between complementary techniques is a significant restriction. The acquisition systems available up to now have forced a choice because EELS, EDS, and fast scanning have not been designed to work together, resulting in inefficient data collection.

Although many samples in electron microscopy are phase objects, as in the case of optical microscopy, we cannot directly measure phase modulation by microscopy. Dennis Gabor proposed a technique called in-line holography to record both amplitude and phase information at the rather early stage of electron microscopy (in 1947). With the development of highly coherent field emission electron sources, another type of holography, off-axis holography, became available for electrons. However, holography cannot be applied to general cases, since there is a requirement for a vacuum region where the reference wave passes through.

With advancements in aberration correction, the spatial resolution of scanning transmission electron microscopy (STEM) has been enormously improved. In addition to the reduction of the STEM probe size, a dramatic increase in the STEM probe current has been realized, leading to the routine acquisition of high-resolution elemental and chemical maps using electron energy loss spectrometry (EELS). Using EELS combined with these advanced STEM instruments, atomic-level resolution information can be obtained from various types of materials, revealing the nature of interfaces, elemental distribution, presence of defects, and much more. In addition to simple elemental composition distributions, EELS is capable of delivering information about the chemical bonding, local atomic coordination, oxidation states, band gaps, and chemical phases of a broad range of materials at the fundamental resolution limit of the property being probed. Atomic-level EELS maps of these fundamental material properties can now be obtained with the acquisition time, to a large extent, limited only by the speed of the EELS spectrometer and not by the signal being measured. The availability of fast EELS spectrometers with large angular collection efficiencies has closed the gap between the rate of signal generation in the specimen and the speed at which this signal can be detected. This significantly increases the amount of information that can be acquired using EELS. Using the most recent generation of spectrometers, EELS data can be acquired at well over 1,000 spectra per second with a high-duty cycle. Fifth-order spectral aberration correction in this generation of spectrometers allows the use of the large collection angles needed to match the increased convergence angle that Cs-probe-corrected systems present, improving collection efficiency while maintaining energy resolution. These advances, when taken together, result in a well matched source/detector system capable of recording high-energy EELS edges at atomic resolution at a rate fast enough to limit electron beam damage to the sample.