Techniques and Applications of Confocal Microscopy
Research Article
The Culmination of 25 Years of Carl Zeiss Laser Scanning Microscopy
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- 05 August 2007, pp. 1558-1559
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Scanning Confocal Electron Microscopy
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- 05 August 2007, pp. 1560-1561
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Characterization of Heterogeneous Materials with the Confocal Raman AFM
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- 05 August 2007, pp. 1562-1563
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X-ray Microscopy in Physical and Biological Sciences
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Soft X-ray Tomography of Biological Cells and Tissues at 15-50 nm Resolution
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- 05 August 2007, pp. 1564-1565
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Panoramic Confocal Imaging
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- 05 August 2007, pp. 1566-1567
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Hard X-ray Microscopy and Tomography
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- 05 August 2007, pp. 1568-1569
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Multi-length Scale X-ray Tomography using Laboratory and Synchrotron Sources
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- 05 August 2007, pp. 1570-1571
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NanoCT: Visualizing of Internal 3D-Structures with Submicrometer Resolution
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- 05 August 2007, pp. 1572-1573
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Quantitative Reconstruction of Differential Phase Contrast Images Obtained With a Configured Detector Using a Scanning Transmission X-Ray Microscope
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- 05 August 2007, pp. 1574-1575
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X-ray Ultramicroscopy Within an XL30 Environmental SEM
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- 05 August 2007, pp. 1576-1577
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Scanning Probe Microscopy for Nanoscale Characterization of Functional Materials and Electronic Devices
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Imaging and Mechanical Probing of Soft Matter with Atomic Force Microscopy
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- 05 August 2007, pp. 1578-1579
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Nanoscale Mechanical Characterization Using Atomic Force Microscopy
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- 05 August 2007, pp. 1580-1581
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Mapping the Nucleation and Growth of Ferroelectric Domains Using Switching Spectroscopy Piezoresponse Force Microscopy
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- 05 August 2007, pp. 1582-1583
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Microscopic and Spectroscopic Study of Interactions Between Amphiphilic Peptides and Single-Walled Carbon Nanotubes
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- 05 August 2007, pp. 1584-1585
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Nanometer Scale Patterning Using Replacement Lithography: Approach and Potential Utility in Molecular Electronics
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- 05 August 2007, pp. 1586-1587
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Determination of the Molecular Architecture of Supported Lipid-Protein Films using Atomic Force Microscopy and Spectroscopic Ellipsometry
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- 05 August 2007, pp. 1588-1589
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Nano Thermal Analysis of Chemicals, Polymers, Thin Films and Coatings
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- 05 August 2007, pp. 1590-1591
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Review of Environmental Scanning Probe Microscopy
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- 05 August 2007, pp. 1592-1593
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Spatial Resolution, Information Limit, and Contrast Transfer in Piezoresponce Force Microscopy
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- 05 August 2007, pp. 1594-1595
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Nanoindentation and Nanotribological Testing Facilities at the Major Analytical Instrumentation Center
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- 05 August 2007, pp. 1596-1597
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