Atom Probe Tomography: an Evolving Technique for Nanostructural Characterization
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Challenges of Atom Probe Analysis of Transistor Channels
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- 05 August 2007, pp. 1598-1599
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Thermal Stability and Reaction of Magnetic Sensor Materials
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- 05 August 2007, pp. 1600-1601
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Analysis Techniques For Nanoscale Solute Clustering In Atom Probe Tomography
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- 05 August 2007, pp. 1602-1603
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Definition of Spatial Resolution in Atom Probe Tomography
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- 05 August 2007, pp. 1604-1605
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Femtosecond Laser Atom Probe Tomography: Principles and Applications
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- 05 August 2007, pp. 1606-1607
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3D Atom Probe Analysis of Quantum Well and Quantum Dot Materials
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- 05 August 2007, pp. 1608-1609
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Estimation of the Effective Temperature of field Evaporated Ions in a Laser-pulsed Atom Probe
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- 05 August 2007, pp. 1610-1611
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Atom Probe Tomography Studies of FePt Thin Films
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- 05 August 2007, pp. 1612-1613
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Nanostructure Analysis by Laser Assisted 3D Atom Probe
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- 05 August 2007, pp. 1614-1615
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Atom Probe Reconstruction Refinements by Pre- and Post- Analysis TEM Structure Quantification
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- 05 August 2007, pp. 1616-1617
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Effects of Zr on the Microstructure and Mechanical Properties of Al-Sc-Yb Alloys
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- 05 August 2007, pp. 1618-1619
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GP Zone Evolution in Al-Ag Alloys
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- 05 August 2007, pp. 1620-1621
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Probing Elemental Partitioning between Alpha and Beta Phases in Titanium Alloys Using 3D Atom Probe Tomography
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- 05 August 2007, pp. 1622-1623
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Precipitate Size Distributions and Compositions of Cu-rich Precipitates in an Fe(Cu) Alloy Studied by Local-Electrode Atom-Probe (LEAP) Tomography
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- 05 August 2007, pp. 1624-1625
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Precipitation and its Development in Maraging Steels Investigated by AP and EFTEM What is the Role of Mo?
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- 05 August 2007, pp. 1626-1627
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Using Atom Probe to Understand the Influence of Silicon on the Phase Separation in PH Stainless Steels
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- 05 August 2007, pp. 1628-1629
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Laser LEAP Characterization of a Zr52.5Cu17.9Ni14.6Al10Ti5 Bulk Metallic Glass
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- 05 August 2007, pp. 1630-1631
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Effect of Re Addition on the Microstructural Stability of Inconel 706 Superalloy at Elevated Temperatures
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- 05 August 2007, pp. 1632-1633
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Recent Advances in FIB-based Site-specific Atom Probe Specimen Preparation Techniques
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- 05 August 2007, pp. 1634-1635
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Assessment of the Tomographic Atom Probe Technique for Nanoscale Characterization : Comparison with SIMS Technique
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- 05 August 2007, pp. 1636-1637
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