Quantitative X-ray Microanalysis
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Reevaluating Acquisition Parameters for Elemental Quantification with EDS
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- 05 August 2007, pp. 1436-1437
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X-ray Analysis of Nano-structures Using the INCAPentaFET-x3 Si(Li) detector
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- 05 August 2007, pp. 1438-1439
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The Effect of the Specimen Charging on the Accuracy of X-ray Analysis in the Variable Pressure SEM
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- 05 August 2007, pp. 1440-1441
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Quantitative X-ray Mapping: The Only Elemental Maps that You Should Report
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- 05 August 2007, pp. 1442-1443
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Benefits of Combined Evaluation of EPMA and Micro-XRF Spectra of Same Specimen in Scanning Electron Microscopes
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- 05 August 2007, pp. 1444-1445
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Theoretical Study about Si L2,3 Spectra with The Cluster Calculation
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- 05 August 2007, pp. 1446-1447
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The FE-WDS-EPMA Analysis of the Segregation at the Grain Boundary of Stainless Steel
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- 05 August 2007, pp. 1448-1449
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Glycine-sodium Nitrate, GSN: a Low Temperature Redetermination
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- 05 August 2007, pp. 1450-1451
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Analysis of Oxide Thin Specimens at 30 and 200 Kv with the Ionic Compound Method
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- 05 August 2007, pp. 1452-1453
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Cryo-SEM for Biological and Materials Samples
Research Article
Cryo-SEM: a Workstation for High-resolution Surface Imaging, Structural and Compositional Analysis and Sample Preparation of Frozen Organic or Hydrated Samples
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- 05 August 2007, pp. 1454-1455
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Site-specific Observation and 3D Studies of Soft Materials Using Cryo-FIB SEM
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- 05 August 2007, pp. 1456-1457
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Strategies for the Fine-Morphological Analysis of Fully Hydrated and Lifelike-preserved Biological and Clinical Material in the SEM
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- 05 August 2007, pp. 1458-1459
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Use of Focused Ion Beam Milling for Preparation of Frozen-Hydrated Specimens for TEM Tomography
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- 05 August 2007, pp. 1460-1461
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Novel Sample Containments for High Pressure Freezing
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- 05 August 2007, pp. 1462-1463
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Cryo-SEM Study of Liquid Crystals in a Thiol-ene Polymer
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- 05 August 2007, pp. 1464-1465
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Variable Pressure Electron Microscopy and Electron Beam Assisted Deposition
Research Article
Expanding the Nano-Toolbox for Electron Microscopy - Combining In-situ Nanomanipulation and Electron Beam Deposition
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- 05 August 2007, pp. 1466-1467
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Understanding Electron-Beam-Induced Deposition and Etching via a Monte - Carlo Based, 3D Growth Simulation with Gas Dynamics
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- 05 August 2007, pp. 1468-1469
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Nanostructure Fabrication by Ultra-high Resolution Environmental Scanning Electron Microscopy
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- 05 August 2007, pp. 1470-1471
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Determination of Impurity Carbon sp2/sp3 Bond Ratio in Electron Beam Deposited Tungsten Nanostructures using Electron Energy Loss Spectroscopy
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- 05 August 2007, pp. 1472-1473
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Biological ESEM. A Review and Future Prospects
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- 05 August 2007, pp. 1474-1475
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