Microscopy and Microanalysis: Volume 24 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 24 - August 2018

Physical Science Symposia

Modulating Electron Beams in Space and Time to Probe for Structure and Function of Soft and Hard Matter

Abstract

Elucidating Mechanisms for Electron Beam Damage in Conjugated Polymers

Local Structural Analysis of Graphitic Carbon Nitrides

Electronic and Structural Characterization of Diamondoid Carbon Nanothreads by Transmission Electron Microscopy

Graphene Defect Editing, Deposition, and Growth via E-Beam-Induced Organic Reactions in Aberration Corrected STEM

Study of the Crystalline and Mesoporous Structure of a Heterogeneous Catalyst (ZSM-5) in Relation to Al, Si and Other Heteroatom, Distribution by Transmission Electron Microscopy

Validation of Minimum Electron Beam Dosage on Characterization of Carbon-Depletion in ULK Dielectric Materials by EELS Quantifications

Observing the Chemical Transformation of MnBn Catalyzed by Cu under Electron Beam Irradiation

The Effect of a Pulsed Electron Beam on Damage Threshold

Morphological Characterization of Tri-Continuous Conductive PP/PMMA/EAA Carbon Black Composites

Ultrafast Transmission Electron Microscopy with High-Coherence Electron Pulses

TEM Characterization of Ball Milled Synthesized CIGS, CIS and CGS Nanoparticles for Energy Applications

Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Earth Materials

Abstract

A Combined Cathodoluminescence and Wavelength Dispersive Spectrometry Study of Ti Zoning in Quartz from the Tuolumne Intrusive Suite in Yosemite, CA

Confocal Raman-in-SEM Imaging: a New Method for 3D Morphology of Asbestos like Fibers in a Mineral Matrix - Complementarity with SEM-FIB.

Stone-Cold Low Temperature Cathodoluminescence Spectrometry of Quartz (SiO2)

Iron La and LP X-ray Lines: a Comparison of EPMA Measurements and Theoretical Calculations, With Possible Implications for Oxidation Determination

Material Discrimination at High Spatial Resolution using Sub-300eV X-rays

Crystallographic Orientation Information by Soft X-Ray Spectroscopy

Analysis of Redox Changes in Silicate Glasses Using EPMA and Raman Spectroscopy

Investigation of Nitrogen in Silicate Glasses and Iron Alloys by SXES

You Do What in Your Microprobe?! The EPMA as a Multimode Platform for Nitride Semiconductor Characterization

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 24 - August 2018

Physical Science Symposia

Modulating Electron Beams in Space and Time to Probe for Structure and Function of Soft and Hard Matter

Abstract

Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Earth Materials

Abstract