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Graphene Defect Editing, Deposition, and Growth via E-Beam-Induced Organic Reactions in Aberration Corrected STEM

Published online by Cambridge University Press:  01 August 2018

Ondrej Dyck ,
Songkil Kim ,
Sergei V. Kalinin  and
Stephen Jesse
Ondrej Dyck
Affiliation:
Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, USA Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Songkil Kim
Affiliation:
Department of Mechanical Engineering, Pusan National University, Republic of Korea
Sergei V. Kalinin
Affiliation:
Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, USA Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Stephen Jesse
Affiliation:
Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, USA Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1994 - 1995
Copyright
© Microscopy Society of America 2018 

References

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