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Scientific Program
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- 27 June 2006, pp. 89-140
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Author Index
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- 27 June 2006, pp. 141-151
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In Situ and other Advanced Microscopy and Microanalysis of Catalytic Materials: Nanoparticles and Porous Solids for Catalysis, Energy and Environment
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Observation of Pt Atoms, Clusters and Rafts on Oxide Supports, by Sub-Ångström Z-Contrast Imaging in an Aberration-Corrected STEM/TEM
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- 31 July 2006, pp. 50-51
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Exhibitor Directory
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- 27 June 2006, pp. 152-153
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In Situ and other Advanced Microscopy and Microanalysis of Catalytic Materials: Nanoparticles and Porous Solids for Catalysis, Energy and Environment
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3D-TEM Study of Gamma Alumina Catalyst Supports
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- 31 July 2006, pp. 52-53
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Company Directory
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- 27 June 2006, pp. 154-166
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Quantitative X-ray Microanalysis: A Symposium Honoring Art Chodos
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A New Method for Quantitative X-ray Microanalysis on a FEG-SEM
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- 31 July 2006, pp. 54-55
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Product and Services Directory
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- 27 June 2006, pp. 167-175
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Quantitative X-ray Microanalysis: A Symposium Honoring Art Chodos
Research Article
Relationship Between Quartz Trace Elements and SEM-Cathodoluminescence Textures Revealed Using WDS Mapping Techniques
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- 31 July 2006, pp. 56-57
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Development of Ultra-Soft X-ray Spectrometer for Electron Probe Microanalysis
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- 31 July 2006, pp. 58-59
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Index to Advertisers
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- 27 June 2006, p. 176
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50th Anniversary of Observation of Dislocations
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Characterization of Dislocations with a Local Electrode Atom Probe: Practical Considerations and Limitations
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- 31 July 2006, pp. 60-61
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In-situ TEM Deformation Study of Dislocation-Precipitate Interactions in Al Alloys
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- 31 July 2006, pp. 62-63
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Dissociation of Grain Boundary Dissociation in Oxide Ceramics
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- 31 July 2006, pp. 64-65
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Visualizing and Measuring Mechanical Behavior at Small Length Scales
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Strain Tensor Mapping at the Nanoscale using Electron Back Scatter Diffraction
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- 31 July 2006, pp. 66-67
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In-situ Micro-sample Mechanical Testing in the SEM
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- 31 July 2006, pp. 68-69
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From Hardness Testing Relying on Optical Imaging to Quantitative In-Situ Nanoindentation in a Transmission Electron Microscope
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- 31 July 2006, pp. 70-71
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Microscopy and Microanalysis of Magnetic Materials
Research Article
Imaging of Domain Structures and Magnetization Dynamics Using X-ray Photoemission Electron Microscopy (X-PEEM)
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- 31 July 2006, pp. 72-73
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Interactions Between Magnetic Domain Walls and APBs in Ni2MnGa
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- 31 July 2006, pp. 74-75
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Information Storage Technology: The Role of the TEM
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- 31 July 2006, pp. 76-77
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