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From Hardness Testing Relying on Optical Imaging to Quantitative In-Situ Nanoindentation in a Transmission Electron Microscope

Published online by Cambridge University Press:  31 July 2006

OL Warren ,
SA S Asif ,
AM Minor ,
Z Shan  and
EA Stach
OL Warren
Affiliation:
Hysitron,Inc.
SA S Asif
Affiliation:
Hysitron,Inc.
AM Minor
Affiliation:
Lawrence Berkeley National Laboratory
Z Shan
Affiliation:
Lawrence Berkeley National Laboratory
EA Stach
Affiliation:
Purdue University
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Research Article
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 70 - 71
Copyright
© 2006 Microscopy Society of America

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