Microscopy and Microanalysis: Volume 12 -

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Volume 12 - August 2006

Contents

Page 10 of 50

Approaching the 1-Å barrier in the CTEM

Research Article

Present Status of Cs-corrected HRTEM and Future Prospects
N Tanaka, J Yamasaki, K Hirahara, K Yoshida, K Saitoh
Published online by Cambridge University Press:

31 July 2006, pp. 158-159
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Information Content in Aberration Corrected High-Resolution TEM Images
M Hytch, F Houdellier, E Snoeck, M-J Casanove
Published online by Cambridge University Press:

31 July 2006, pp. 160-161
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Transcending the One-Ångström Atomic Resolution Barrier in the TEM
MA O'Keefe, LF Allard, SJ Pennycook, DA Blom
Published online by Cambridge University Press:

31 July 2006, pp. 162-163
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Present and future limits of variable pressure and environmental SEM: Enabling nanoscale metrology, improved x-ray microanalysis and the understanding of novel contrasts in images of modern and novel materials

Research Article

Modeling Dynamic Secondary Electron Contrast Effects from Insulators in Low Vacuum SEM
B Thiel, E Tatem
Published online by Cambridge University Press:

31 July 2006, pp. 164-165
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Chamber Gas Luminescence in the VPSEM and Optimisation of a Gas Luminescence VPSE Detector
B Griffin
Published online by Cambridge University Press:

31 July 2006, pp. 166-167
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Electron Flux Controlled Switching Between Electron Beam Induced Etching and Deposition
M Toth, R Knowles, G Hartigan, C Lobo
Published online by Cambridge University Press:

31 July 2006, pp. 168-169
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Evidence for the Gaussian Scttering of Electrons in a Gas
D Joy, X Tang
Published online by Cambridge University Press:

31 July 2006, pp. 170-171
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Cathodoluminescence in the Scanning Electron Microscope

Research Article

Low Energy CL Spectroscopy of Interfaces and Nanostructures
L Brillson
Published online by Cambridge University Press:

31 July 2006, pp. 172-173
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Cathodoluminescence of Elongated Semiconductor Nano- and Microstructures
J Piqueras
Published online by Cambridge University Press:

31 July 2006, pp. 174-175
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Luminescence Micro-Characterization of epitaxial ZnO and ZnO-based Heterostructures
F Bertram
Published online by Cambridge University Press:

31 July 2006, pp. 176-177
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

IMOD - A tool for 3-D reconstruction by TEM tomography

Research Article

Tomographic Reconstruction with the IMOD Software Package
D Mastronarde
Published online by Cambridge University Press:

31 July 2006, pp. 178-179
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Tomography in Biological and Materials Sciences

Research Article

Three-dimensional Structure of the Tiny Bacterium Pelagibacter ubique Studied by Cryo-electron Tomography
D Nicastro, C Schwartz, J Pierson, J-C Cho, SJ Giovannoni, JR McIntosh
Published online by Cambridge University Press:

31 July 2006, pp. 180-181
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Transmission Electron Microtomography (TEMT) of Nanostructured Polymers under Dynamically Evolving Conditions
RJ Spontak, MB Braunfeld, DA Agard, H Jinnai
Published online by Cambridge University Press:

31 July 2006, pp. 182-183
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Vertical Resolution in the Confocal STEM – Present and Future
AY Borisevich, AR Lupini, PO Nellist, S Pennycook
Published online by Cambridge University Press:

31 July 2006, pp. 184-185
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

General Metallographic Techniques & Applications

Research Article

Chemical Etching and Staining of Ferrous Powder Metallurgy Materials
T Murphy
Published online by Cambridge University Press:

31 July 2006, pp. 186-187
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Materials Compatibility for Whole Airliner Decontamination - a Microstructural Investigation
WF Gale, C Callender, N Sofyan, J McMcAllister, HS Gale
Published online by Cambridge University Press:

31 July 2006, pp. 188-189
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Failure Analysis & Prevention

Research Article

The Columbia Debris Loan Program - Examples of Microscopic Analysis
R Russell, S Thurston, S Smith, A Marder, G Steckel
Published online by Cambridge University Press:

31 July 2006, pp. 190-191
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Fatigue Failures of Fasteners: Optical Metallography and SEM Fractography
D Susan, A Kilgo, B McKenzie
Published online by Cambridge University Press:

31 July 2006, pp. 192-193
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Microwave Processing in a Modern Microscopy Facility

Research Article

Microwave Processing in a Modern Microscopy Facilty
E Humphrey
Published online by Cambridge University Press:

31 July 2006, pp. 194-195
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Failure Analysis & Prevention

Research Article

Using Metallography,Scanning Electron Microscope and Energy Dispersive Spectroscopy Techniques to enhance failure analysis on aerospace componets
WE Heady
Published online by Cambridge University Press:

31 July 2006, pp. 196-197
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 10 of 50

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Volume 12 - August 2006

Approaching the 1-Å barrier in the CTEM

Research Article

Present and future limits of variable pressure and environmental SEM: Enabling nanoscale metrology, improved x-ray microanalysis and the understanding of novel contrasts in images of modern and novel materials

Research Article

Cathodoluminescence in the Scanning Electron Microscope

Research Article

IMOD - A tool for 3-D reconstruction by TEM tomography

Research Article

Tomography in Biological and Materials Sciences

Research Article

General Metallographic Techniques & Applications

Research Article

Failure Analysis & Prevention

Research Article

Microwave Processing in a Modern Microscopy Facility

Research Article

Failure Analysis & Prevention

Research Article