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Volume 12 - August 2006

Contents

Page 43 of 50

Present and future limits of variable pressure and environmental SEM: Enabling nanoscale metrology, improved x-ray microanalysis and the understanding of novel contrasts in images of modern and novel materials

Abstract

  • Enhanced High Speed SE Imaging in a VPSEM Using a Frisch Grid

  • MR Phillips, SW Morgan
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1480-1481
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Modeling Noise in Gas Cascade Secondary Electron Amplifiers

  • V Tileli, B Thiel
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1482-1483
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Comparison of the Swelling of Treated and Untreated Hair Using an Environmental Electron Microscope (ESEM)

  • P Hallégot, S Diridollou, V Holloway-Barbosa, F Leroy, NJ Zaluzec
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1484-1485
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Wet STEM - A New SEM Method Revealing High Resolution Transmitted Information from Hydrated Samples

  • I Gestmann, D Bultreijs, E Baken, B Lich
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1486-1487
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Report from the NIST-MAS-AMAS Roadmap Workshop on Variable Pressure Scanning Electron Microscopy/Environmental Scanning Electron Microscopy

  • S Wight, D Newbury, B Griffin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1488-1489
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • The Effect of the Charge Compensating Gas and Beam Gas Path Length on X-ray Analysis in the Variable Pressure SEM

  • SJ Bean, VM Kugler
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1490-1491
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Performance of X-ray Microanalysis in the Variable Pressure or Environmental Scanning Electron Microscope

  • J-F Le Berre, K Robertson, R Gauvin, GP Demopoulos
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1492-1493
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Current Status of Quantitative X-ray Microanalysis in VP-ESEM

  • R Carlton
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1494-1495
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Visualization of the Electron-solid Interaction Volume in Dielectric Materials Under Variable Pressure Conditions

  • B Myers, V Dravid
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1498-1499
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Dynamic Volume Change Measurement in Environmental Scanning Electron Microscope

  • X Tang, M De Rooij
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1500-1501
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Correlative Analysis of Polymer Materials Using Low Voltage and Variable Pressure SEM

  • S Okerstrom, K Pham
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1502-1503
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Imaging of Bacterial External Polymeric Substances by Methods of SEM

  • B Arey, A Laskin, A Dohnalkova
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1504-1505
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Scanning Electron Microscopy

Abstract

  • 3D Reconstruction of Surfaces with Steep Slopes from Multiple SEM Images

  • R Danzl, F Helmli, S Scherer
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1506-1507
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Cathodoluminescence in the Scanning Electron Microscope

Abstract

  • Local Stress Assessment in Patterned Interlayer Dielectric Films using Cathodoluminescence Spectroscopy

  • S Kakinuma, M Kodera, K Nishikata, J Aoyama, Y Saijo, G Pezzotti
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1508-1509
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Effects of Lithium Doping and Post-processing on the Cathodoluminescence of Zinc Oxide Nanoparticles

  • K McBean, M Phillips, D Drouin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1510-1511
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • CASINO a Powerful Simulation Tool for Cathodoluminescence Applications

  • D Drouin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1512-1513
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Combined SEM Electron-Beam-Induced Current and Cathodoluminescence Imaging and STEM Structural Analysis of GaN Light Emitting Diodes

  • CM Parish, CL Progl, ME Salmon, PE Russell
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1514-1515
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • A Cathodoluminescene (and Raman) Imaging and Spectroscopic Study of Ancient Polycrystalline Diamond

  • EP Vicenzi, T Rose, M Fries, A Steele, C Magee
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1518-1519
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 43 of 50