Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Le Berre, J. F.
Demopoulos, G. P.
and
Gauvin, R.
2007.
Skirting: A Limitation for the Performance of X‐ray Microanalysis in the Variable Pressure or Environmental Scanning Electron Microscope.
Scanning,
Vol. 29,
Issue. 3,
p.
114.