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Characterisation of Epitaxial Lateral Overgrown GaN by Electron Backscatter Diffraction Correlated with Cross-Sectional Cathodoluminescence Spectroscopy

Published online by Cambridge University Press:  31 July 2006

F Sweeney ,
C Trager-Cowan ,
P Edwards ,
A Wilkinson  and
I Watson
F Sweeney
Affiliation:
University of Strathclyde,UK
C Trager-Cowan
Affiliation:
University of Strathclyde,UK
P Edwards
Affiliation:
University of Strathclyde,UK
A Wilkinson
Affiliation:
University of Oxford
I Watson
Affiliation:
University of Strathclyde,UK

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1516 - 1517
Copyright
© 2006 Microscopy Society of America