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Contamination Removal Rates Improved by New Impedance Matching Network, for the Evactron® De-Contaminator

Published online by Cambridge University Press:  26 July 2009

CG Morgan  and
R Vane
CG Morgan
Affiliation:
XEI Scientific,Inc
R Vane
Affiliation:
XEI Scientific,Inc

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 812 - 813
Copyright
Copyright © Microscopy Society of America 2009