Microscopy and Microanalysis: Volume 27 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 27 - August 2021

Analytical Sciences Symposia

Advances in Analytical STEM-in-SEM

Methods of the electron induced cleanning in SEM

Challenges and perspectives of Transmission Kikuchi Diffraction for nanocrystalline materials characterization

Determining Lattice Parameters by Curve-Fitting Transmission Kikuchi Diffraction Patterns

Quantification and Mitigation of Electron-Beam-Induced Carbon Contamination

Vendor Symposium

The novel approach to correlative microscopy using AFM-in-SEM and CPEM technology

3D Correlative Microscopy for Real World Problem Solving

Safe and Quantitative Analysis of Nuclear Materials From the Milli to Nano-Scale

Time resolved dynamic micro-CT imaging of food products in the lab

Challenges in Atom Probe Tomography Instrumentation and Reconstruction

Moon Dust, Minerals and Microscopy

Quantitative Compositional Mapping of Particles from the Apollo 17 Core 73002

STEM-EELS-EDS Analysis of Space Weathering Features of ANGSA Lunar Soil Samples

Coordinated analyses on space weathering signatures on a Fe-sulfide grain from asteroid Itokawa

Investigating space-weathering on the moon using APT

Unresolved Challenges in Quantitative X-ray Microanalysis

NeXL: A Platform for Innovation in Microanalysis

Improved quantitative chemical analyses of Cu(In,Ga)Se2 solar cells performed by STEM/EDXS

A New Method for the XEDS ζ-factor Measurement Through Modulation of Beam Current.

Chemical Shift Detection with Energy Dispersive Spectroscopy (EDS)

First Light on the Argonne PicoProbe and The X-ray Perimeter Array Detector (XPAD)

Biological Sciences Symposia

Cryo-electron Tomography: Present Capabilities and Future Potential

Molecular views into cellular functions by in-cell cryo-electron tomography

Waffle Method for optimizing cryo-FIB-milling

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 27 - August 2021

Analytical Sciences Symposia

Advances in Analytical STEM-in-SEM

Vendor Symposium

Moon Dust, Minerals and Microscopy

Unresolved Challenges in Quantitative X-ray Microanalysis

Biological Sciences Symposia

Cryo-electron Tomography: Present Capabilities and Future Potential