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Challenges in Atom Probe Tomography Instrumentation and Reconstruction

Published online by Cambridge University Press:  30 July 2021

David Reinhard ,
David Larson ,
Brian Geiser ,
Dan Lenz ,
Isabelle Martin ,
Ty Prosa ,
Peter Clifton ,
Robert Ulfig  and
Joe Bunton
David Reinhard
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
David Larson
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Brian Geiser
Affiliation:
CAMECA Instruments Inc., United States
Dan Lenz
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA, United States
Isabelle Martin
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA, United States
Ty Prosa
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA, Wisconsin, United States
Peter Clifton
Affiliation:
Cameca, United States
Robert Ulfig
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Joe Bunton
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA, United States

Abstract

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Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2038 - 2040
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

“LEAP 5000: 3D Atom Probe Microscope”. https://www.cameca.com/products/apt/leap-5000 (accessed January 24, 2021).Google Scholar
Larson, D. J., et al. , Micro. Microanal. 20(S2) (2014) 2088.CrossRefGoogle Scholar
Bas, P., et al. , Appl. Surf. Sci. 87/88 (1995) 298.CrossRefGoogle Scholar
Hono, K., et al. Ultramicroscopy 111, (2011) p. 576.CrossRefGoogle Scholar
Houard, J. et al. , (2014, Aug 31 – Sept 5). Toward a deep UV atom probe [Poster session]. 54th IFES Conference on Atom Probe Tomography & Microscopy.Google Scholar
Kanitani, Y, et al. , Jpn. J. Appl. Phys. 58 (2019) 096505.CrossRefGoogle Scholar
Prosa, T. J. et al. , Micro. Microanal (2021) submitted.Google Scholar
Kelly, T. F. et al. , Surf. Sci 246 (1991) 396.CrossRefGoogle Scholar
Larson Larson, D. J. et al. , Micro. Microanal (2021) submitted.Google Scholar
Bunton, J. H. and Van Dyke, M. S., “Wide Field of View Atom Probe”, United States Patent 10,615,001, April 7, 2020.Google Scholar
Geiser, B. P., et al. , Micro. Microanal. 26(2) (2020) 2622.Google Scholar