Physical Sciences Symposia
Probing the Properties of Nanomaterials with Microscopy
Abstract
Correlated Twins in Nanowires
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- Published online by Cambridge University Press:
- 01 August 2010, pp. 1808-1809
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Technical Considerations for Improving Near-Field Enhancement Optical Microscopy
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- 01 August 2010, pp. 1810-1811
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Characterization of the Ternary Compound Pd5Pt3Ni2 for PEMFC Cathode Electrocatalysts
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- 01 August 2010, pp. 1812-1813
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Imaging Li-Ion Dynamics in Energy Storage Materials on the Nanometer Scales
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- 01 August 2010, pp. 1814-1815
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Fourier Analysis of Deformations of Catalytic Gold Nanoparticles under Reaction Conditions
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- 01 August 2010, pp. 1816-1817
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Microcharacterization of Core Shell Nanocrystallites
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- 01 August 2010, pp. 1818-1819
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Controlling the Size and Composition of Iron Nanoparticles for Carbon Nanotube Growth
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- 01 August 2010, pp. 1820-1821
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Atomic and Electronic Structure of Graphene Based on HRTEM and Ab-Initio Calculations
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- 01 August 2010, pp. 1822-1823
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High Resolution Non-Linear Spectroscopic Imaging
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- 01 August 2010, pp. 1824-1825
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Investigations of Domain Structures in La0.7Ca0.3MnO3 Single Crystals
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- 01 August 2010, pp. 1826-1827
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3DEM: Quantitative Analysis at the Nano and Microscale using Tomographic Techniques
Abstract
3D EBSD Characterization of Deformed Polycrystalline Micro-scale Tensile Samples
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- 01 August 2010, pp. 1828-1829
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Acquisition and Analysis of a 1.2 Gbyte FIB/SEM Tomographic Spectral Image
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- 01 August 2010, pp. 1830-1831
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Image Processing and Quantification in FIB Reconstuctions. Tin Whisker and Hillock Case Study
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- 01 August 2010, pp. 1832-1833
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Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy
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- 01 August 2010, pp. 1834-1835
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Three Dimensional Characterization of a Silica Hollow Sphere with an Iron Oxide Core by Annular Dark Field Scanning Confocal Electron Microscopy
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- 01 August 2010, pp. 1836-1837
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Extending the Depth of Field in Aberration-Corrected STEM by 3D Sectioning
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- 01 August 2010, pp. 1838-1839
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Quantitative EFTEM and STEM Tomography of Soft Materials
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- 01 August 2010, pp. 1840-1841
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3D Elemental Mapping in Nanomaterials by Core-Loss EFTEM Tomography
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- 01 August 2010, pp. 1842-1843
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Three-Dimensional Evaluation of a Multi-Walled Carbon Nanotube Probe by Using High-Resolution Transmission Electron Microscope
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- 01 August 2010, pp. 1844-1845
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Computational Approach of High Efficiency CT (HECT)TM in TEM/STEM
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- 01 August 2010, pp. 1846-1847
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