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Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

Published online by Cambridge University Press:  01 August 2010

PD Nellist ,
P Wang ,
G Behan ,
AI Kirkland ,
A Hashimoto ,
M Shimojo ,
K Mitsuishi ,
M Takeguchi ,
E Cosgriff  and
AJ D'Alfonso
...Show all authors
PD Nellist
Affiliation:
University of Oxford, United Kingdom
P Wang
Affiliation:
University of Oxford, United Kingdom
G Behan
Affiliation:
University of Oxford, United Kingdom
AI Kirkland
Affiliation:
University of Oxford, United Kingdom
A Hashimoto
Affiliation:
National Institute for Materials Science, Japan
M Shimojo
Affiliation:
National Institute for Materials Science, Japan
K Mitsuishi
Affiliation:
National Institute for Materials Science, Japan
M Takeguchi
Affiliation:
National Institute for Materials Science, Japan
E Cosgriff
Affiliation:
University of Melbourne, Australia
AJ D'Alfonso
Affiliation:
University of Melbourne, Australia
LJ Allen
Affiliation:
University of Melbourne, Australia
SD Findlay
Affiliation:
The University of Tokyo, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1834 - 1835
Copyright
Copyright © Microscopy Society of America 2010