Microscopy and Microanalysis: Volume 16 -

Quantitative Analysis of Materials Structures Based on 3D Image Data
K Schladitz, M Godehardt, C Kübel
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01 August 2010, pp. 1848-1849
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Quantitative Analysis of Electron Tomograms Using Auto- and Cross-Correlations
H Friedrich, C Gommes, P de Jongh, K de Jong
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01 August 2010, pp. 1850-1851
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Statistical Methods for Image Segmentation and Tomography Reconstruction
M Comer, C Bouman, J Simmons
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01 August 2010, pp. 1852-1853
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Template Matching as a Tool to Analyze Electron Tomograms
R Schoenmakers, A Yakushevska, M Storms
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01 August 2010, pp. 1854-1855
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

The Atom TOMography (ATOM) Concept
MK Miller, TF Kelly
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01 August 2010, pp. 1856-1857
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Applying Multivariate Statistical Analysis to Atom Probe Tomography
C Parish, C Capdevila, MK Miller
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01 August 2010, pp. 1858-1859
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Focused Ion Beam Fabrication of Solidified Ferritin into Nanoscale Volumes for Compositional Analysis Using Time-of-Flight Mass Spectrometry Methods
M Greene, TJ Prosa, DJ Larson, TF Kelly
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01 August 2010, pp. 1860-1861
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Depth Profiling Magnetic Structure Using Scanning Electron Microscopy with Polarization Analysis (SEMPA)
B McMorran, D Pierce, J Unguris
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01 August 2010, pp. 1862-1863
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Serial Block Face Imaging of Aluminium
J Mancuso, T Hashimoto, G Thompson
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01 August 2010, pp. 1864-1865
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Angular Butterfly Fourier Filter for Suppression of Ray Artifacts in Tomographic Reconstructions
L Kovacik
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01 August 2010, pp. 1866-1867
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Limits of Tomographic Reconstruction of Discrete Nanoparticles
X Wang, M Malac, A Meldrum, R Lockwood, P Li, H Furukawa
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01 August 2010, pp. 1868-1869
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

High-Throughput 3D Visualization of Large Volumes at High Resolution by 3ViewTM
A Dohnalkova, D Kennedy, J Mancuso, M Marshall, P Mainwaring, J Fredrickson
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01 August 2010, pp. 1870-1871
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Xray Tomographic Microscopic Studies a Resin Embedded Paint Sample from a Mechanical Failing Area in the Floor Tiles of The Art of Painting by Johannes Vermeer (1632-1675)
J Boon, E Oberthaler, E Ferreira, F Marone, M Stampanoni
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01 August 2010, pp. 1872-1873
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Quantitative Electron Tomography of Size-Controlled Metallic Nanodots on Sintered Titania Photocatalysts
K Yoshida, PL Gai, S Sueda, N Tanaka
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01 August 2010, pp. 1874-1875
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

3D Complete-Tilt Electron Tomography of Semiconductor Nanowires
J Wu, S Xie, E Hemesath, L Lauhon, VP Dravid
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01 August 2010, pp. 1876-1877
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Combining Time-Resolved Deformation Experiments with Electron Tomography to Understand Dislocation-Particle Interactions
G Liu, IM Robertson
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01 August 2010, pp. 1878-1879
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Utilizing Diffraction-Contrast Tomographic Reconstructions to Understand Hydride Volume Expansion Accommodation Processes in Zr Alloy
C Smith, IM Robertson
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01 August 2010, pp. 1880-1881
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Influence of Precipitation Sequence on the 3D TaC + Ta2C/Ta4C3 Microstructure Processed by Vacuum Plasma Spraying
R Morris, D Butts, P Shade, GB Thompson
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01 August 2010, pp. 1882-1883
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Investigation of Ultra High Strength Steel with 3DTEM and 3D Atom Probe
M Hartshorne, C McCormick, P Novotny, M Schmidt, DN Seidman, M Taheri
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01 August 2010, pp. 1884-1885
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Electron Tomography of Si and Er Particles in SiOx film Without Missing Wedge
P Li, P Concepcion, X Wang, M Malac, A Meldrum
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01 August 2010, pp. 1886-1887
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Volume 16 - July 2010

Physical Sciences Symposia

3DEM: Quantitative Analysis at the Nano and Microscale using Tomographic Techniques

Abstract

Quantitative Analysis of Materials Structures Based on 3D Image Data

Quantitative Analysis of Electron Tomograms Using Auto- and Cross-Correlations

Statistical Methods for Image Segmentation and Tomography Reconstruction

Template Matching as a Tool to Analyze Electron Tomograms

The Atom TOMography (ATOM) Concept

Applying Multivariate Statistical Analysis to Atom Probe Tomography

Focused Ion Beam Fabrication of Solidified Ferritin into Nanoscale Volumes for Compositional Analysis Using Time-of-Flight Mass Spectrometry Methods

Depth Profiling Magnetic Structure Using Scanning Electron Microscopy with Polarization Analysis (SEMPA)

Serial Block Face Imaging of Aluminium

Angular Butterfly Fourier Filter for Suppression of Ray Artifacts in Tomographic Reconstructions

Limits of Tomographic Reconstruction of Discrete Nanoparticles

High-Throughput 3D Visualization of Large Volumes at High Resolution by 3ViewTM

Xray Tomographic Microscopic Studies a Resin Embedded Paint Sample from a Mechanical Failing Area in the Floor Tiles of The Art of Painting by Johannes Vermeer (1632-1675)

Quantitative Electron Tomography of Size-Controlled Metallic Nanodots on Sintered Titania Photocatalysts

3D Complete-Tilt Electron Tomography of Semiconductor Nanowires

Combining Time-Resolved Deformation Experiments with Electron Tomography to Understand Dislocation-Particle Interactions

Utilizing Diffraction-Contrast Tomographic Reconstructions to Understand Hydride Volume Expansion Accommodation Processes in Zr Alloy

Influence of Precipitation Sequence on the 3D TaC + Ta2C/Ta4C3 Microstructure Processed by Vacuum Plasma Spraying

Investigation of Ultra High Strength Steel with 3DTEM and 3D Atom Probe

Electron Tomography of Si and Er Particles in SiOx film Without Missing Wedge

Microscopy and Microanalysis

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Volume 16 - July 2010

Physical Sciences Symposia

3DEM: Quantitative Analysis at the Nano and Microscale using Tomographic Techniques

Abstract