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Characterization of Localized Degradation in Reverse-Biased GaN HEMTs by Scanning Transmission Electron Microscopy and Electron Holography

Published online by Cambridge University Press:  01 August 2010

DA Cullen ,
DJ Smith ,
A Stocco ,
G Meneghesso ,
E Zanoni  and
MR McCartney
DA Cullen
Affiliation:
Arizona State University
DJ Smith
Affiliation:
Arizona State University
A Stocco
Affiliation:
University of Padova, Italy
G Meneghesso
Affiliation:
University of Padova, Italy
E Zanoni
Affiliation:
University of Padova, Italy
MR McCartney
Affiliation:
Arizona State University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 800 - 801
Copyright
Copyright © Microscopy Society of America 2010