Hostname: page-component-7479d7b7d-c9gpj Total loading time: 0 Render date: 2024-07-08T10:37:36.706Z Has data issue: false hasContentIssue false
  • English
  • Français

Helium Ion Microscopy for the Characterization of Complex 3D Structures in a C/CrC Nanocomposite

Published online by Cambridge University Press:  01 August 2010

Z Zhou ,
MAE Jepson ,
X Liu ,
WM Rainforth  and
C Rodenburg
Z Zhou
Affiliation:
The University of Sheffield, United Kingdom
MAE Jepson
Affiliation:
The University of Sheffield, United Kingdom
X Liu
Affiliation:
Carl Zeiss NTS, Germany
WM Rainforth
Affiliation:
The University of Sheffield, United Kingdom
C Rodenburg
Affiliation:
The University of Sheffield, United Kingdom

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 602 - 603
Copyright
Copyright © Microscopy Society of America 2010