Instrumentation and Techniques Symposia
Surface Microscopy and Microanalysis in Materials and Biological Systems
Abstract
The Importance of Complementary Information Provided by Surface Analysis, Electron Microscopy and in situ Characterization of Nanoparticles
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- 01 August 2010, pp. 408-409
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The Blind Men and the Elephant as a Metaphor for Surface Analysis, as Applied to the Preparation and Analysis of New, Highly Stable Materials for Separations Science
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- 01 August 2010, pp. 410-411
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SIMS Imaging and 3D Microanalysis of Organic Structures
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- 01 August 2010, pp. 412-413
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Multi-Technique Surface Analytical Characterization of Dessication-Resistant Supported Lipid Monolayers
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- 01 August 2010, pp. 414-415
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The Role of Surface Chemistry in Specimen Preparation for Structure-Function Determination of Nanomaterials and Biological Systems
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- 01 August 2010, pp. 416-417
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NanoSIMS and TEM: Complementary Techniques in the Search for the Earliest Life on Earth
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- 01 August 2010, pp. 418-419
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Cellular Distribution of a Gold(I) Based Anti-Cancer Compound: A Complementary NanoSIMS and EFTEM Study
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- 01 August 2010, pp. 420-421
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New Methods for Imaging, Isotopic Labeling, and Analyzing Termite Gut Microbes with SEM and NanoSIMS
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- 01 August 2010, pp. 422-423
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Effect of Counter-Ion Charge and Hydration on Poly(3,4-ethylenedioxythiophene) (PEDOT) Studied with X-ray Photoelectron Spectroscopy
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- 01 August 2010, pp. 424-425
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Stable Isotope Probing of RNA Combining Phylogenetic Microarrays and High Resolution Secondary Ion Mass Spectrometry to Link Composition and Function in Microbial Systems
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- 01 August 2010, pp. 426-427
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The Chemistry of Environmental Interfaces: A Joined X-ray Spectromicroscopy and NanoSIMS Approach
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- 01 August 2010, pp. 428-429
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Direct Measurement of Kinetic Energy Dissipation in Polysaccharide Conformation Transition at Single Molecule Level
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- 01 August 2010, pp. 430-431
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Complete Analysis of Samples using Complementary Techniques
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- 01 August 2010, pp. 432-433
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Analysis of Metal Nanoparticles in Biological Tissues Specimens Using Various Surface Analytical Techniques
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- 01 August 2010, pp. 434-435
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Automated XPS Analysis of Passivated Stainless Steel to the SEMI Standard
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- 01 August 2010, pp. 436-437
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Chemically Stable High Resolution Surface Patterning by Thiolated DNA for Self Assembly of Nanocircuits on a Gold Nano-Dot Surface
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- 01 August 2010, pp. 438-439
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High Depth Resolution Auger Depth Profiling Analysis Using Inclined Holder
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- 01 August 2010, pp. 440-441
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XPS and FESEM/STEM Surface Characterization of Activated Carbon, Carbon Black, and Carbon Nanotubes
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- 01 August 2010, pp. 442-443
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Scanned Probe Microscopies: Probing Advanced Material Properties on the Micro- and Nano-Scale
Abstract
Nonlinear Interaction Imaging and Spectroscopy in Scanning Probe Microscopy
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- Published online by Cambridge University Press:
- 01 August 2010, pp. 444-445
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Compositional Imaging of Heterogeneous Materials with Single-Pass Kelvin Force Microscopy
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- 01 August 2010, pp. 446-447
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