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Complete Analysis of Samples using Complementary Techniques

Published online by Cambridge University Press:  01 August 2010

VS Smentkowski ,
D Wark ,
L Le Tarte ,
H Piao ,
JC Chera ,
SG Ostrowski  and
A Suzuki
VS Smentkowski
Affiliation:
GE Global Research Center
D Wark
Affiliation:
GE Global Research Center
L Le Tarte
Affiliation:
GE Global Research Center
H Piao
Affiliation:
GE Global Research Center
JC Chera
Affiliation:
GE Global Research Center
SG Ostrowski
Affiliation:
GE Global Research Center
A Suzuki
Affiliation:
GE Global Research Center

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 432 - 433
Copyright
Copyright © Microscopy Society of America 2010