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Volume 16 - July 2010

Contents

Page 16 of 57

Instrumentation and Techniques Symposia

Transmission EM and Spectroscopy at or Near Realistic Conditions

Abstract

  • Imaging Specific Protein Labels on Eukaryotic Cells in Liquid with Scanning Transmission Electron Microscopy

  • N de Jonge, M Dukes, EA Ring, D Drouin, DB Peckys
  • Published online by Cambridge University Press:
    01 August 2010, pp. 328-329
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Development of a New Closed-type Environmental-cell Specimen Holder with High Gas Conductivity

  • T Kawasaki, T Miura, H Tsutsui, T Matsutani, T Tanji
  • Published online by Cambridge University Press:
    01 August 2010, pp. 332-333
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Imaging and energy-loss characteristics for in vitro TEM analysis of nanoparticles

  • KL Klein, N de Jonge, IM Anderson
  • Published online by Cambridge University Press:
    01 August 2010, pp. 334-335
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Liquid Scanning Transmission Electron Microscopy of Individual Quantum Dots Labeling Epidermal Growth Factor Receptors in Whole Cells

  • MJ Dukes, DB Peckys, N de Jonge
  • Published online by Cambridge University Press:
    01 August 2010, pp. 336-337
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Fast mechanical shutter in Hitachi HF 3300, a 60 kV to 300 kV TEM

  • M Malac, RA McLeod, P Li, WC Bigelow, JY Howe, LF Allard, Jr, Y Taniguchi, MS Moreno
  • Published online by Cambridge University Press:
    01 August 2010, pp. 338-339
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Low-voltage electron microscopy (LVEM) of carbon nanotubes and poly(3,4-ethylene dioxythiophene) (PEDOT)

  • J Wu, B Shim, DC Martin
  • Published online by Cambridge University Press:
    01 August 2010, pp. 340-341
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Minimization of Hydrocarbon Accumulation on Nanomanipulator Probe Tips

  • G McMahon, CG Morgan, R Vane
  • Published online by Cambridge University Press:
    01 August 2010, pp. 342-343
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Local Thickness Measurement in TEM

  • H Zhang, RF Egerton, M Malac
  • Published online by Cambridge University Press:
    01 August 2010, pp. 344-345
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Preparation of [001]45ºtilt Quasi-periodic Grain Boundaries in Aluminium for HREM Studies by Cross Rolling and Annealing

  • M Shamsuzzoha
  • Published online by Cambridge University Press:
    01 August 2010, pp. 346-347
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • In-Situ Super Rapid Heating of Nano-Aluminum and Nano-Thermites

  • KS Sullivan, W-A Chiou, R Fiore, M Zachariah
  • Published online by Cambridge University Press:
    01 August 2010, pp. 348-349
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Microstructure Evolution of Sol-gel Derived Oxide Nanostructures with In-Situ TEM

  • A Yan, VP Dravid
  • Published online by Cambridge University Press:
    01 August 2010, pp. 350-351
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • The Effect of Ca on the Reduction of CaO Doped FeO by Carbon

  • N Ishikawa, T Ogiwara, M Takeguchi, Y Oba, T Inami
  • Published online by Cambridge University Press:
    01 August 2010, pp. 352-353
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Surface Microscopy and Microanalysis in Materials and Biological Systems

Abstract

  • Advances in Auger Electron Spectroscopy and its Applications in the Field of Nanotechnology

  • SN Raman, DF Paul, JS Hammond, DG Watson
  • Published online by Cambridge University Press:
    01 August 2010, pp. 354-355
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Determination of the Oxidation State of Irradiated Nuclear Fuel Using SIMS

  • CT Walker, S Bremier, F Belloni, D Manara, R Hasnoui, M Ernstberger
  • Published online by Cambridge University Press:
    01 August 2010, pp. 356-357
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • X-ray Photoelectron Spectromicroscopy

  • DJ Surman, C Blomfield, A Roberts, C Moffitt
  • Published online by Cambridge University Press:
    01 August 2010, pp. 358-359
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Experimental Evaluation of the Depth Resolution of a Raman Microscope

  • F Adar, E Lee, S Mamedov, A Whitley
  • Published online by Cambridge University Press:
    01 August 2010, pp. 360-361
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Imaging Material Response During Laser Modification of Fused Silica

  • RN Raman, RA Negres, SG Demos
  • Published online by Cambridge University Press:
    01 August 2010, pp. 362-363
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Mapping Quantitative Mechanical Properties at Molecular Scale Using Peak Force Tapping AFM

  • C Su
  • Published online by Cambridge University Press:
    01 August 2010, pp. 364-365
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • ToF-SIMS Microanalysis of Patterned Protein Surfaces

  • DG Castner
  • Published online by Cambridge University Press:
    01 August 2010, pp. 366-367
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 16 of 57