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X-ray Photoelectron Spectromicroscopy

Published online by Cambridge University Press:  01 August 2010

DJ Surman ,
C Blomfield ,
A Roberts  and
C Moffitt
DJ Surman
Affiliation:
Kratos Analytical Inc
C Blomfield
Affiliation:
Kratos Analytical Ltd
A Roberts
Affiliation:
Kratos Analytical Ltd
C Moffitt
Affiliation:
Kratos Analytical Inc

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 358 - 359
Copyright
Copyright © Microscopy Society of America 2010