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Atomic Scale Characterization of LSFMO Thin Films Using Aberration Corrected STEM

Published online by Cambridge University Press:  01 August 2010

M Gu ,
Y Takamura  and
ND Browning
M Gu
Affiliation:
University of California, Davis
Y Takamura
Affiliation:
University of California, Davis
ND Browning
Affiliation:
University of California, Davis

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 146 - 147
Copyright
Copyright © Microscopy Society of America 2010