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MSA and MAS Sustaining Members
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- 31 January 2003, p. 25
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Measurement of Automotive Catalyst Washcoat Loading Parameters by Microscopy Techniques
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- 29 January 2003, pp. 267-281
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Origin of Threefold Periodicity in High-Resolution Transmission Electron Microscopy Images of Thin Film Cubic SiC
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- 29 January 2003, pp. 420-427
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Atomic Structures of Oxygen-associated Defects in Sintered Aluminum Nitride Ceramics
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- 08 August 2002, pp. 352-357
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Tomographic Atom Probe: New Dimension in Materials Analysis
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- 31 July 2002, pp. 39-47
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Improved Count Rate and Resolution Performance of a Thermoelectrically Cooled Si(Li) X-ray Detector
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- 31 July 2002, pp. 120-125
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Comparative Surface Studies at Atomic Resolution with Ultrahigh Vacuum Variable-Temperature Atomic Force and Scanning Tunneling Microscopes
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- 31 July 2002, pp. 208-215
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Multi-photon Excitation Microscopy and Confocal Microscopy Imaging of In Vivo Human Skin: A Comparison
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- 29 January 2003, pp. 282-289
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Other
Meeting Rooms and Registration Area Map
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- 31 January 2003, p. 33
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Shared Resources And User Facilities: Access To Instrumentation
The High Temperature Material Laboratory: A National User Facility For Advanced Materials Characterization
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- 02 July 2020, pp. 8-9
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Direct Evidence for Grain Boundary Potential Barrier Breakdown via In Situ Electron Holography
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- 29 January 2003, pp. 428-436
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Low-loss Electron Energy-loss Spectroscopy and Dielectric Function of Biological and Geological Polymorphs of CaCO3
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- 08 August 2002, pp. 358-364
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Correlating Atomic Scale Experimental Observations to Develop Three-Dimensional Structural Models for Grain Boundaries in Oxides
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- 31 July 2002, pp. 48-57
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Plasma Cleaning and Its Applications for Electron Microscopy
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- 31 July 2002, pp. 126-135
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Program Committee
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Society Officers
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Iterative X-ray Cone-Beam Tomography for Metal Artifact Reduction and Local Region Reconstruction
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- 31 July 2002, pp. 58-65
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Empirical Identification of Uranium Oxides and Fluorides Using Electron Energy-loss Spectroscopy in the Transmission Electron Microscope
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- 29 January 2003, pp. 437-444
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Method for Cross-sectional Transmission Electron Microscopy Specimen Preparation of Composite Materials Using a Dedicated Focused Ion Beam System
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- 08 August 2002, pp. 365-370
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