Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-26T18:22:56.239Z Has data issue: false hasContentIssue false
  • English
  • Français

Comparative Surface Studies at Atomic Resolution with Ultrahigh Vacuum Variable-Temperature Atomic Force and Scanning Tunneling Microscopes

Published online by Cambridge University Press:  31 July 2002

Masashi Iwatsuki ,
Kazuyuki Suzuki ,
Shin-ich Kitamura  and
Mike Kersker
Masashi Iwatsuki
Affiliation:
Electron Optics Division, JEOL Ltd., Tokyo, Japan
Kazuyuki Suzuki
Affiliation:
Electron Optics Division, JEOL Ltd., Tokyo, Japan
Shin-ich Kitamura
Affiliation:
Electron Optics Division, JEOL Ltd., Tokyo, Japan
Mike Kersker
Affiliation:
JEOL USA, Inc., Peabody, MA
Get access

Abstract

With the ultrahigh vacuum variable-temperature scanning tunneling microscope (UHV-VT-STM), atomic-level observation has been achieved. An ultrahigh vacuum atomic force microscope (UHV-AFM) has also been developed, with success in obtaining atom images where observation in noncontact (NC) mode with a frequency modulation (FM) detection method was attempted. Using the FM detection method in the constant oscillation amplitude of the cantilever excitation mode, we have obtained atomic-resolution images of Si(111) 7 × 7 structures and Si(100) 2 × 1 structures and other structures together with STM images in an ultrahigh vacuum environment. Also shown here are contact potential difference (CPD) images using the NC-AFM method.

Type
Articles
Information
Microscopy and Microanalysis , Volume 5 , Issue 3 , May 1999 , pp. 208 - 215
Copyright
© 1999 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)