Microscopy and Microanalysis: Volume 14 -

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Volume 14 - August 2008

Contents

Page 19 of 48

High Resolution and Analytical Characterization of Engineered Nanostructures

Research Article

Quantitative Characterisation of Surfaces and Defects on PtRu Nanoparticles Using Combined Exit Wave Restoration and Aberration-Corrected TEM
LY Chang, C Maunders, EA Baranova, C Bock, GA Botton
Published online by Cambridge University Press:

03 August 2008, pp. 426-427
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Direct Structural Investigation of Bi3.25La0.75Ti3O12 thin films on SrRuO3/(111) SrTiO3
L Gunawan, O Gautreau, C Harnagea, A Pignolet, GA Botton
Published online by Cambridge University Press:

03 August 2008, pp. 428-429
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Atomic-Level Gas-Solid Interaction during In Situ Redox Processes in Ceria
R Wang, PA Crozier, R Sharma, J Adams
Published online by Cambridge University Press:

03 August 2008, pp. 430-431
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Deep RIE and Cryo-Etching of Nanostructures in Silicon and Polymers
G DeRose, M Shearn, D Henry, Y Chen, A Scherer
Published online by Cambridge University Press:

03 August 2008, pp. 432-433
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Nanobead Formation and Nanopatterning in Glasses
G Möbus, J Tsai, XJ Xu, P Bingham, G Yang
Published online by Cambridge University Press:

03 August 2008, pp. 434-435
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Atomic-resolution Studies of Ca3Co4O9 using in-situ Scanning Transmission Electron Microscopy
G Yang, Y Zhao, K Sader, A Bleloch, RF Klie
Published online by Cambridge University Press:

03 August 2008, pp. 436-437
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Characterization of Al In GaN/GaN Heterointerface by HAADF-STEM and Electron Holography
M Takeguchi, H Okuno, Y Irokawa, Y Sakuma, K Furuya
Published online by Cambridge University Press:

03 August 2008, pp. 438-439
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Preparation and characterization of titanate nanotubes
M Klementová, Z Kváča, P Bezdička, E Večerníková, M Mohyla
Published online by Cambridge University Press:

03 August 2008, pp. 440-441
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Nucleation and Growth of Magnetic Nanoparticles in a Na-Ca-B-Fe Amorphous Precursor by Electron Beam Irradiation
MA Laurenzi III, W-A Chiou, IL Pegg
Published online by Cambridge University Press:

03 August 2008, pp. 442-443
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Tomography of High-k Dielectrics on Fin-FET Sidewalls
B Foran, N Ives, P Lysaght
Published online by Cambridge University Press:

03 August 2008, pp. 444-445
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Physical and electrical characterization of the interface between atomic-layer-deposited Al2O3 on GaAs substrates for CMOS applications
DI Garcia-Gutierrez, V Kaushik, D Shahrjerdi, S Banerjee
Published online by Cambridge University Press:

03 August 2008, pp. 446-447
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Exploring the Morphological Diversity of Amyloid's Cross-β Structure
WS Childers, Y Liang, R Ni, AK Mehta, JV Taylor, DG Lynn
Published online by Cambridge University Press:

03 August 2008, pp. 448-449
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Stress Relaxation by Cation Ordering in Epitaxial Lead Zirconate Titanate Films
L Zhang, A Vasiliev, IB Misirlioglu, SP Alpay, M Aindow, R Ramesh
Published online by Cambridge University Press:

03 August 2008, pp. 450-451
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Interface Structure of a V2O3 Layer Grown on Cu3Au (001) by Cs Corrected Transmission Electron Microscopy
H Calderon, H Niehus, B Freitag, D Wall, F Stavale, CA Achete
Published online by Cambridge University Press:

03 August 2008, pp. 452-453
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Performance Advantages of a Modern, Ultra-High Mass Resolution Atom Probe
P Clifton, T Gribb, S Gerstl, RM Ulfig, DJ Larson
Published online by Cambridge University Press:

03 August 2008, pp. 454-455
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Analysis of Silicon Nanowires by Laser Atom Probe Tomography Prepared by a Protected Lift-Out Processing Technique
T Prosa, R Alvis, L Tsakalakos, V Smentkowski
Published online by Cambridge University Press:

03 August 2008, pp. 456-457
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Microstructural Investigation of Pd/Pt/Au and Pd/Ru/Au Ohmic Contacts to InAlSb/InAs Heterostructures for High Electron Mobility Transistors
Q Zhang, R Dormaier, S Mohney
Published online by Cambridge University Press:

03 August 2008, pp. 458-459
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Nanofabrication by 3D E-beam Cutting
T Gnanavel, Z Saghi, Y Peng, G Möbus
Published online by Cambridge University Press:

03 August 2008, pp. 460-461
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Characterization with TEM of AlN/GaN Heterostructures for Implant Activation Annealing
TS Zheleva, CE Hager, KA Jones, MA Derenge
Published online by Cambridge University Press:

03 August 2008, pp. 462-463
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Surface Microscopy and Microanalysis in Materials and Biological Systems

Research Article

Characterizing Nanomaterials by Combining Electron Microscopy and Surface Analysis
DJ Gaspar, DR Baer, Z Zhu, BW Arey, C Wang, MG Warner, AL Miracle
Published online by Cambridge University Press:

03 August 2008, pp. 464-465
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 19 of 48

Microscopy and Microanalysis

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Volume 14 - August 2008

High Resolution and Analytical Characterization of Engineered Nanostructures

Research Article

Quantitative Characterisation of Surfaces and Defects on PtRu Nanoparticles Using Combined Exit Wave Restoration and Aberration-Corrected TEM

Direct Structural Investigation of Bi3.25La0.75Ti3O12 thin films on SrRuO3/(111) SrTiO3

Atomic-Level Gas-Solid Interaction during In Situ Redox Processes in Ceria

Deep RIE and Cryo-Etching of Nanostructures in Silicon and Polymers

Nanobead Formation and Nanopatterning in Glasses

Atomic-resolution Studies of Ca3Co4O9 using in-situ Scanning Transmission Electron Microscopy

Characterization of Al In GaN/GaN Heterointerface by HAADF-STEM and Electron Holography

Preparation and characterization of titanate nanotubes

Nucleation and Growth of Magnetic Nanoparticles in a Na-Ca-B-Fe Amorphous Precursor by Electron Beam Irradiation

Tomography of High-k Dielectrics on Fin-FET Sidewalls

Physical and electrical characterization of the interface between atomic-layer-deposited Al2O3 on GaAs substrates for CMOS applications

Exploring the Morphological Diversity of Amyloid's Cross-β Structure

Stress Relaxation by Cation Ordering in Epitaxial Lead Zirconate Titanate Films

Interface Structure of a V2O3 Layer Grown on Cu3Au (001) by Cs Corrected Transmission Electron Microscopy

Performance Advantages of a Modern, Ultra-High Mass Resolution Atom Probe

Analysis of Silicon Nanowires by Laser Atom Probe Tomography Prepared by a Protected Lift-Out Processing Technique

Microstructural Investigation of Pd/Pt/Au and Pd/Ru/Au Ohmic Contacts to InAlSb/InAs Heterostructures for High Electron Mobility Transistors

Nanofabrication by 3D E-beam Cutting

Characterization with TEM of AlN/GaN Heterostructures for Implant Activation Annealing

Surface Microscopy and Microanalysis in Materials and Biological Systems

Research Article

Characterizing Nanomaterials by Combining Electron Microscopy and Surface Analysis

Microscopy and Microanalysis

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Volume 14 - August 2008

High Resolution and Analytical Characterization of Engineered Nanostructures

Research Article

Surface Microscopy and Microanalysis in Materials and Biological Systems

Research Article