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Volume 17 - February 2011

Contents

Page 43 of 58

Physical Sciences

Structural and Physical properties of Thin Films, Interfaces, and Grain Boundaries

Abstract

  • Grain Boundary Complexions in TiO2 Bicrystals Doped with CuO

  • S Ma, T Pennycook, M Oxley, D Leonard, C Kiely, S Pennycook, M Harmer
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1336-1337
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Quantitative Study of an Incommensurate Grain Boundary Using Aberration Corrected Microscopy

  • A Gautam, T Radetic, F Lançon, U Dahmen
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1338-1339
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • HRTEM Study of Dissociated Dislocation Structures in Low-Angle Grain Boundaries of Alumina

  • E Tochigi, N Shibata, A Nakamura, T Mizoguchi, T Yamamoto, Y Ikuhara
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1340-1341
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Evolution of a Small Angle Boundary from a Perfect Lattice During Annealing of a Cross Rolled Aluminium Sample

  • M Shamsuzzoha
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1342-1343
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Line Defects at Interfaces in Telluride-Based Thermoelectric Materials

  • D Medlin, J Sugar, N Heinz, T Ikeda, G Snyder
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1344-1345
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Characterizing Texture and Grain Boundaries in Nanoscale Cu Interconnects by Precession Electron Diffraction

  • K Ganesh, A Darbal, S Rajasekhara, G Rohrer, K Barmak, P Ferreira
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1346-1347
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • In situ TEM Investigation of electrical Current Effect on Aluminum Interconnect

  • D Xie, Z Shan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1348-1349
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Characterization of Strontium Oxide Layers on Silicon for CMOS High-K Gate Stack Scaling

  • J Bruley, M Frank, C Marchiori, J Fompeyrine, V Narayanan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1350-1351
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Evaluation of Defect Structures from In Situ Dielectric Breakdown of SiO2-Based Gate Dielectric Layers

  • C Bonifacio, K van Benthem
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1352-1353
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Microstructural Characterization of Closely-Lattice-Matched AlIn(Ga)N Alloys for High Electron Mobility Transistors

  • L Zhou, L Kirste, T Lim, R Aidam, O Ambacher, D Smith
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1354-1355
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • 2-D Mapping of Ferroelectric Domains by Transmission Electron Microscopy

  • X Pan, C Nelson, Y Zhang, S Kim, B Winchester, L Chen, A Melville, C Adamo, D Schlom, C Folkman, S Baek, C Eom
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1356-1357
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • In-Situ Cross-Sectional Switching of Multiferroic BiFeO3 Thin Films

  • C Nelson, P Gao, J Jokisaari, B Winchester, Y Gu, C Heikes, A Melville, C Adamo, S Baek, C Folkman, C Eom, D Schlom, L Chen, X Pan
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1360-1361
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • In situ TEM Studies of Ferroelectric Thin Films

  • P Gao, C Nelson, J Jokisaari, S Baek, C Eom, E Wang, X Pan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1362-1363
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Electron Microscopy of Ferroelectric Domain Switching in PbZr0.2Ti0.8O3 Thin Films

  • M-G Han, M Schofield, L Wu, C Ma, J Pulecio, J Hoffman, F Walker, C Ahn, Y Zhu
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1364-1365
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Determination of Thin-Film Ferroelectric Polarity at the Nanoscale

  • J LeBeau, A D'Alfonso, L Allen, S Stemmer
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1366-1367
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Microanalysis of Ferromagnetic-Ferroelectric Interfaces Using Analytical Electron Microscopy

  • P Sankara Rama Krishnan, Y Jan-Chi, C Ying-Hao, N Valanoor, P Munroe
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1368-1369
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Atomic and Electronic Interface Structure of a VN Hard Coating on MgO

  • Z Zhang, G Dehm, B Rashkova, P Lazar, J Redinger, R Podloucky
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1370-1371
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • In Situ TEM Observation of Atomic-Level Shear Deformation for Nano Tribological Research

  • T Sato, T Ishida, L Jalabert, H Fujita
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1372-1373
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Twinning Evolution of Faceted Face-Centered Cubic Fe Nanoparticles under Electron Irradiation

  • N Lu, J Wang, T Ling, J Zhu
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1374-1375
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 43 of 58