Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Plenary

M&M 2016 Plenary Session Symposium

Abstract

Creating the Malaria Lifecycle Animations

Materials and Their Characterization in the 21st Century

Sorby Award

Abstract

From Correlative Microscopy to 3D Understanding of Material Microstructures

Analytical and Instrumentation Science Symposia

Vendor Symposium: New Tools for Life and Materials Sciences

Abstract

Innovative Air Protection Sample Holder for Ion Milling-SEM-SPM and Shared-Alignment Sample Holder for SEM-SPM

A New, Versatile, High Performance SEM

Sample Preparation Using Broad Argon Ion Beam Milling for Electron Backscatter Diffraction (EBSD) Analysis

THE NANOWORKBENCH: Automated Nanorobotic system inside of Scanning Electron or Focused Ion Beam Microscopes

Enhancing Materials and Device Analysis Capability in the SEM and FIB-SEM by using a Nanomanipulator

The Application of the AZtec EBSD System to the Study of Strain in the SEM

New Developments in RISE Microscopy: Correlative Raman and SEM Imaging

Scanning Electron Microscopes with Integrated Raman Spectrometer Revealing New Complementary Information

Why We Need to Use 3D Fourier Transform Analysis to Evaluate a High-performance TEM

Reducing the Missing Wedge in TEM Tomography

Array Tomography and Beam Deceleration – High-Throughput Imaging with the ZEISS GeminiSEM using Atlas 5 and Beam Deceleration

Helios G4: Pushing the Limits of TEM Sample Preparation and STEM Resolution

Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities

Ultra-High Vacuum Aberration-Corrected STEM for in-situ studies

Integrated Differential Phase Contrast (iDPC)–Direct Phase Imaging in STEM for Thin Samples

Mass Thickness Measurement in TEM: A New Single Standard Method for Convenient Quantification by TEM EDS

Novel Silicon Drift Detector Devices for Ultra-Fast, High-Resolution X-ray Spectroscopy

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Plenary

M&M 2016 Plenary Session Symposium

Abstract

Sorby Award

Abstract

Analytical and Instrumentation Science Symposia

Vendor Symposium: New Tools for Life and Materials Sciences

Abstract