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Ultra-High Vacuum Aberration-Corrected STEM for in-situ studies

Published online by Cambridge University Press:  25 July 2016

M.T. Hotz ,
G.J. Corbin ,
N. Dellby ,
O.L. Krivanek ,
C. Mangier  and
J.C. Meyer
M.T. Hotz
Affiliation:
Nion Co., 11511 NE 118th St., Kirkland, WA 98034, USA
G.J. Corbin
Affiliation:
Nion Co., 11511 NE 118th St., Kirkland, WA 98034, USA
N. Dellby
Affiliation:
Nion Co., 11511 NE 118th St., Kirkland, WA 98034, USA
O.L. Krivanek
Affiliation:
Nion Co., 11511 NE 118th St., Kirkland, WA 98034, USA
C. Mangier
Affiliation:
Dept. of Physics, University of Vienna, Boltzmanngasse 5, 1090 Vienna, Austria
J.C. Meyer
Affiliation:
Dept. of Physics, University of Vienna, Boltzmanngasse 5, 1090 Vienna, Austria

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 34 - 35
Copyright
© Microscopy Society of America 2016 

References

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