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Why We Need to Use 3D Fourier Transform Analysis to Evaluate a High-performance TEM

Published online by Cambridge University Press:  25 July 2016

Kazuo Ishizuka
Affiliation:
National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, Japan HREM Research Inc., 14-48 Matsukazedai, Higashimatsuyama, Saitama, Japan
Koji Kimoto
Affiliation:
National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, Japan Department of Applied Chemistry, Kyushu University, 1-1 Namiki, Tsukuba, Ibaraki, Japan

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Haider, M., et al, Nature 392 (1998). p. 768.CrossRefGoogle Scholar
[2] Krivanek, K., Dellby, N. & Lupini, A. Ultramicroscopy 78 (1999). p. 1.CrossRefGoogle Scholar
[3] Haider, M., et al, Microsc Microanal 13(S2 (2007). p. 1156CD.CrossRefGoogle Scholar
[4] Barthel, J. & Thust, A. Physical Review Letters 101(2008) p. 200801.CrossRefGoogle Scholar
[5] Haider, M., et al, Micros. Microanal 16 (2010). p. 393.CrossRefGoogle Scholar
[6] Kimoto, K, et al, Ultramicroscopy 121 (2012). p. 31.CrossRefGoogle Scholar
[7] Kimoto, K, et al, Ultramicroscopy 134 (2013). p. 86.CrossRefGoogle Scholar
[8] Ishizuka, K. Ultramicroscopy 5 (1980). p. 55.CrossRefGoogle Scholar
[9] This study was partly supported by the JST Research Acceleration Program and the Nano Platform Program of MEXT, Japan.Google Scholar