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Integrated Differential Phase Contrast (iDPC)–Direct Phase Imaging in STEM for Thin Samples

Published online by Cambridge University Press:  25 July 2016

Ivan Lazic ,
Eric G.T. Bosch ,
Sorin Lazar ,
Maarten Wirix  and
Emrah Yücelen
Ivan Lazic
Affiliation:
FEI Electron Optics, Achtseweg Noord 5, 5651 GG Eindhoven, the Netherlands
Eric G.T. Bosch
Affiliation:
FEI Electron Optics, Achtseweg Noord 5, 5651 GG Eindhoven, the Netherlands
Sorin Lazar
Affiliation:
FEI Electron Optics, Achtseweg Noord 5, 5651 GG Eindhoven, the Netherlands
Maarten Wirix
Affiliation:
FEI Electron Optics, Achtseweg Noord 5, 5651 GG Eindhoven, the Netherlands
Emrah Yücelen
Affiliation:
FEI Electron Optics, Achtseweg Noord 5, 5651 GG Eindhoven, the Netherlands

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 36 - 37
Copyright
© Microscopy Society of America 2016 

References

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