Proceedings of Microscopy & Microanalysis 2013
Physical Sciences
P08.01 Advanced Atomic-Scale Imaging and Spectroscopy of Materials
Abstract
Direct Observation of the Optical Response of Twisted Bilayer Graphene by Electron Energy Loss Spectroscopy
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- 09 October 2013, pp. 1920-1921
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P08.02 Advanced Atomic-Scale Imaging and Spectroscopy of Materials
Abstract
Measuring phase transitions in La1-xSrxCoO3 using in-situ atomic-resolution Z-contrast imaging and EELS
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- 09 October 2013, pp. 1922-1923
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Interplay of Octahedral Rotations, Magnetic and Electronic Properties in Epitaxial LaCoO3 Thin Films
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- 09 October 2013, pp. 1924-1925
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PFM and TEM Characterization of Polarization in Ferroelectric BFO under Changing Mechanical Constraints
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- 09 October 2013, pp. 1926-1927
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Atomic Structure of Surface Dielectric Dead Layer in BiFeO3 Thin Film
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- 09 October 2013, pp. 1928-1929
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Characterization of Structure and Grain Boundary Composition in Undoped and Doped Ceria Synthesized by Spray Drying for Solid Oxide Fuel Cells
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- 09 October 2013, pp. 1930-1931
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Toroidal Plasmonic Eigenmodes in Oligomer Nanocavities for the Visible Detected by EFTEM and 3D-FDTD Simulations
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- 09 October 2013, pp. 1932-1933
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P08.03 Advanced Atomic-Scale Imaging and Spectroscopy of Materials
Abstract
Quantitative Electron Diffraction of Graphene: Measurement of Mean-Square Atomic Displacement and Implications for Dark Field Imaging
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- 09 October 2013, pp. 1934-1935
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Correlative Spectrum Imaging of Organic Photovoltaic Devices using Energy Dispersive X-ray and Electron Energy-Loss Spectroscopy
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- 09 October 2013, pp. 1936-1937
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Identifying the Optical Response of Graphene Using Electron Energy-Loss Spectroscopy
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- Published online by Cambridge University Press:
- 09 October 2013, pp. 1938-1939
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Electronic Properties of TEM-Sculpted Structure in Graphene
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- 09 October 2013, pp. 1940-1941
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AB/AC Stacking Boundaries in Bilayer Graphene
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- 09 October 2013, pp. 1942-1943
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P08.04 Advanced Atomic-Scale Imaging and Spectroscopy of Materials
Abstract
Grain-Boundary Phase Transformation of ZnO:Pr System
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- 09 October 2013, pp. 1944-1945
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Atomic Scale Manipulation of Grain Boundary Structures through Doping and In-Situ Gas Reduction
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- 09 October 2013, pp. 1946-1947
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The Effect of High Temperature Annealing on the Grain Characteristics of a Thin Chemical Vapor Deposition Silicon Carbide Layer
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- 09 October 2013, pp. 1948-1949
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Local Atomic Distortions in Strontium Cobaltite Due to Oxygen Vacancies
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- 09 October 2013, pp. 1950-1951
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Structure and Deformation Mechanism of the Quasicrystal Strengthening Phase in Al-Mn-Be-Cu Alloys
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- 09 October 2013, pp. 1952-1953
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Functional Complex Point-Defect Structure in a Huge-Size-Mismatch System
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- 09 October 2013, pp. 1954-1955
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P08.P1 Advanced Atomic-Scale Imaging and Spectroscopy of Materials
Abstract
Resolution Investigation of Potentiometric-Scanning Ion Conductance Microscopy
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- 09 October 2013, pp. 1956-1957
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High Resolution Transmission Electron Microscopy and Selected Area Diffraction Study of Doped Zinc Oxide Thin Film
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- 09 October 2013, pp. 1958-1959
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