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High Resolution Transmission Electron Microscopy and Selected Area Diffraction Study of Doped Zinc Oxide Thin Film

Published online by Cambridge University Press:  09 October 2013

L. Fang ,
P. Ricou  and
R. Korotkov
L. Fang
Affiliation:
P. Ricou
Affiliation:
R. Korotkov
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1958 - 1959
Copyright
Copyright © Microscopy Society of America 2013