Microscopy and Microanalysis: Volume 10 - Issue S02

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Volume 10 - Issue S02 - August 2004

Contents

Page 29 of 40

Scanned Probe Microscopy: Probing Surfaces at the Nanoscale

Research Article

Combinatorial and High Throughput Microscopy for Thin Film Research
Duangrut Julthongpiput, Wenhua Zhang, Michael J Fasolka
Published online by Cambridge University Press:

01 August 2004, pp. 1108-1109
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

"Holes" on Red Blood Cell Membranes Including Thalassemia Imaged by Atomic Force Microscopy
TAPAN Guha, RADHABALLAV Bhar, KAJAL Bhattacharyya, RATANLAL L Brahmachary
Published online by Cambridge University Press:

01 August 2004, pp. 1110-1111
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

In Situ Electrical Probing by TEM-STM: Instrumentation and Applications for Nanocharacterization
Christële M Grimaud, Oleg R Lourie
Published online by Cambridge University Press:

01 August 2004, pp. 1112-1113
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences

Research Article

Focused Ion Beam Microscopy of Oxide Dispersion Strengthened Molybdenum
R. Baranwal, M. G. Burke, M. W. Phaneuf
Published online by Cambridge University Press:

01 August 2004, pp. 1114-1115
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Mitigation of Localized Charging Induced in Insulating Materials by a Focused Ion Beam
Marion A. Stevens-Kalceff, Katie J. Levick
Published online by Cambridge University Press:

01 August 2004, pp. 1116-1117
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Nanoscale Holes Formed by In Situ Thin Film Deposition in a FIB
Andrew M Minor, Francis Allen, Velimir R Radmilovic, Eric A Stach, Thomas Schenkel
Published online by Cambridge University Press:

01 August 2004, pp. 1118-1119
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Additive Nanopatterning by Platinum Deposition in a Dual Beam FIB
Vidyut Gopal, Eric A Stach, Velimir R Radmilovic
Published online by Cambridge University Press:

01 August 2004, pp. 1120-1121
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Effects of Water Vapour on Electron and Ion Beam Deposited Platinum
Richard M Langford, Dogan Ozkaya, J Sheridan, Richard Chater
Published online by Cambridge University Press:

01 August 2004, pp. 1122-1123
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Site-specific 3D Imaging of Cells and Tissues Using DualBeam Technology
Ingo Gestmann, Mike Hayles, Dan Shi, Ganesh Kumar, Lucille A Giannuzzi, Ben Lich, Sriram Subramaniam
Published online by Cambridge University Press:

01 August 2004, pp. 1124-1125
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Fabrication and Characterization of Micron-Sized Compression Samples using a Focused Ion Beam Microscope
Michael D Uchic, Robert Wheeler IV, Michael J Seekely, Dennis M Dimiduk
Published online by Cambridge University Press:

01 August 2004, pp. 1126-1127
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

3D Materials Characterization using Dual-Beam FIB/SEM Techniques
E Lee, R Williams, G B Viswanathan, R Banerjee, H L Fraser
Published online by Cambridge University Press:

01 August 2004, pp. 1128-1129
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

FIB Preparation of Samples for EBSD: Applications to Wear Studies of MEMS Materials
Joseph R Michael, S. V. Prasad
Published online by Cambridge University Press:

01 August 2004, pp. 1130-1131
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Tomographic Spectral Imaging with a Dual-Beam FIB/SEM: 3D Microanalysis
Paul G. Kotula, Michael R. Keenan, Joseph R. Michael
Published online by Cambridge University Press:

01 August 2004, pp. 1132-1133
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Considerations for Three Dimensional Imaging In the Crossbeam FIB
Eric Lifshin, Edward L. Principe, James Evertsen, Art Dewey, Peter Gnauck, John Friel
Published online by Cambridge University Press:

01 August 2004, pp. 1134-1135
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Augmenting the 3D Characterization Capability of the Dual Beam FIB-SEM
Michael D Uchic, Michael Groeber, Robert Wheeler IV, Frank Scheltens, Dennis M Dimiduk
Published online by Cambridge University Press:

01 August 2004, pp. 1136-1137
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Three-Dimensional (3D) Reconstruction of AlFeSi Intermetallic Particles in 6xxx Aluminum Alloys Using the Focused Ion Beam (FIB)
Steven R Claves, Alexander R Bandar, Wojciech Z Misiolek, Joseph R Michael
Published online by Cambridge University Press:

01 August 2004, pp. 1138-1139
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Characterization of Intergranular Fracture Surfaces in a Ni-Cr-Fe Alloy using SEM, FIB and AEM Techniques
M. G. Burke, W. C. Moshier, G. J. C. Carpenter, M. W. Phaneuf
Published online by Cambridge University Press:

01 August 2004, pp. 1140-1141
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

FIB Preparation for HRTEM: GaN Based Devices
Joerg Ralf Jinschek, Velimir R Radmilovic, Christian Kisielowski
Published online by Cambridge University Press:

01 August 2004, pp. 1142-1143
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

FIB Prepared TEM Sample Lift-out Using MEMS Grippers
Kimberly Tuck, Matthew Ellis, Aaron Geisberger, George Skidmore, Phil Foster
Published online by Cambridge University Press:

01 August 2004, pp. 1144-1145
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Having Your Cake and Eating It Too: A Procedure for Obtaining Plan View and Cross Section TEM Images from the Same Site
R. B. Irwin, A. Anciso, P.J. Jones, C. Patton
Published online by Cambridge University Press:

01 August 2004, pp. 1146-1147
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 29 of 40

Microscopy and Microanalysis

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Volume 10 - Issue S02 - August 2004

Scanned Probe Microscopy: Probing Surfaces at the Nanoscale

Research Article

Combinatorial and High Throughput Microscopy for Thin Film Research

"Holes" on Red Blood Cell Membranes Including Thalassemia Imaged by Atomic Force Microscopy

In Situ Electrical Probing by TEM-STM: Instrumentation and Applications for Nanocharacterization

Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences

Research Article

Focused Ion Beam Microscopy of Oxide Dispersion Strengthened Molybdenum

Mitigation of Localized Charging Induced in Insulating Materials by a Focused Ion Beam

Nanoscale Holes Formed by In Situ Thin Film Deposition in a FIB

Additive Nanopatterning by Platinum Deposition in a Dual Beam FIB

Effects of Water Vapour on Electron and Ion Beam Deposited Platinum

Site-specific 3D Imaging of Cells and Tissues Using DualBeam Technology

Fabrication and Characterization of Micron-Sized Compression Samples using a Focused Ion Beam Microscope

3D Materials Characterization using Dual-Beam FIB/SEM Techniques

FIB Preparation of Samples for EBSD: Applications to Wear Studies of MEMS Materials

Tomographic Spectral Imaging with a Dual-Beam FIB/SEM: 3D Microanalysis

Considerations for Three Dimensional Imaging In the Crossbeam FIB

Augmenting the 3D Characterization Capability of the Dual Beam FIB-SEM

Three-Dimensional (3D) Reconstruction of AlFeSi Intermetallic Particles in 6xxx Aluminum Alloys Using the Focused Ion Beam (FIB)

Characterization of Intergranular Fracture Surfaces in a Ni-Cr-Fe Alloy using SEM, FIB and AEM Techniques

FIB Preparation for HRTEM: GaN Based Devices

FIB Prepared TEM Sample Lift-out Using MEMS Grippers

Having Your Cake and Eating It Too: A Procedure for Obtaining Plan View and Cross Section TEM Images from the Same Site

Microscopy and Microanalysis

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Volume 10 - Issue S02 - August 2004

Scanned Probe Microscopy: Probing Surfaces at the Nanoscale

Research Article

Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences

Research Article