Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-26T14:47:42.399Z Has data issue: false hasContentIssue false
  • English
  • Français

Focused Ion Beam Microscopy of Oxide Dispersion Strengthened Molybdenum

Published online by Cambridge University Press:  01 August 2004

R. Baranwal ,
M. G. Burke  and
M. W. Phaneuf
R. Baranwal
Affiliation:
Bechtel Bettis , West Mifflin, Pennsylvania
M. G. Burke
Affiliation:
Bechtel Bettis , West Mifflin, Pennsylvania
M. W. Phaneuf
Affiliation:
Fibics, Canada
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1114 - 1115
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)