Microscopy and Microanalysis: Volume 10 - Issue S02

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Volume 10 - Issue S02 - August 2004

Contents

Page 25 of 40

Accessorizing the SEM

Research Article

World Trade Center Particulate Contamination Signature
S R Badger, K P Rickabaugh, M S Potter, B E Scheetz, H R Bhattacharjee, R J Lee
Published online by Cambridge University Press:

01 August 2004, pp. 948-949
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

SE and BSE Information from CNT Containing Fe at Various Accelerating Voltages
Shuichi Takeuchi, Atsushi Muto, Mine Nakagawa, Sara White, Ryuichiro Tamochi, Mitsugu Sato, Mitsuhiko Yamada, David C Joy
Published online by Cambridge University Press:

01 August 2004, pp. 950-951
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The Aberration-corrected SEM - the Ultimate Accessory?
D C Joy
Published online by Cambridge University Press:

01 August 2004, pp. 952-953
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Electron Microscopy of Wet Samples from Cells and Tissues to Food, Cosmetics and Medical Devices
Ory Zik , Vered Behar, Amotz Nechushtan
Published online by Cambridge University Press:

01 August 2004, pp. 954-955
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

New Ion Beam Milling System for Fast and Efficient Site Specific Sample Preparation
Astrid Krehan, Alex Vogt, W Gruenewald
Published online by Cambridge University Press:

01 August 2004, pp. 956-957
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Material Analysis Using SEM/EDS Combined with a Raman Spectrometer
Kazuteru Kawauchi, Kazumichi Ogura, Charlie Nielsen, Alan D Brooker, Robert Bennett
Published online by Cambridge University Press:

01 August 2004, pp. 958-959
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Identification and Quantification of Topologically Close Packed Phases (TCP) in Alloy 22 Using Electron Backscatter Diffraction (EBSD) Analysis
Bassem S El-Dasher, Sharon G Torres, Tammy S Summers
Published online by Cambridge University Press:

01 August 2004, pp. 960-961
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Nanomanipulation of Individual Carbon Nanotubes
Rishi Gupta, Taylor M. Cavanah, Marc in het Panhuis
Published online by Cambridge University Press:

01 August 2004, pp. 962-963
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Improved Carbon Analysis with Evactron Plasma Cleaning
Pierre Rolland, Vincent Carlino, Ronald Vane
Published online by Cambridge University Press:

01 August 2004, pp. 964-965
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A Study of the Effects of Evactron® Plasma Cleaning on X-ray Windows
Ronald Vane , Christine Roberts, Vincent Carlino
Published online by Cambridge University Press:

01 August 2004, pp. 966-967
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

RIMAPS and Variogram Analyses of Microwear Traces in Experiments with Stone Tools
Eduardo Alfredo Favret, Nestor Osvaldo Fuentes, Myrian Rosa Alvarez
Published online by Cambridge University Press:

01 August 2004, pp. 968-969
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Improvements for HR- and Cryo-SEM by the VCT 100 High-Vacuum Cryo Transfer System and SEM Cooling Stage
R. Wepf, T. Richter, M. Sattler, A. Kaech
Published online by Cambridge University Press:

01 August 2004, pp. 970-971
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Aberration Correction, Electron Holography, High-Resolution TEM

Research Article

Seeing Atoms at Sub-Ångstrom Resolution with Aberration-Corrected TEM
Michael A. O'Keefe
Published online by Cambridge University Press:

01 August 2004, pp. 972-973
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The Weak Phase Object Approximation: From Small Diffraction Angles In Electron Microscopy To Large Angles In Light Optics
Edgar Voelkl
Published online by Cambridge University Press:

01 August 2004, pp. 974-975
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Cs Corrector for Imaging
Hidetaka Sawada, Takeshi Tomita, Toshikatsu Kaneyama, Fumio Hosokawa, Mikio Naruse, Toshikazu Honda, Peter Hartel, Max Haider, Nobuo Tanaka, Crispin J D Hetherington, Ron C Doole, Angus I Kirkland, John L Hutchison, John M Titchmarsh, David J H Cockayne
Published online by Cambridge University Press:

01 August 2004, pp. 976-977
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

First Experimental Proof of Spatial Resolution Improvement in a Monochromized and Cs-Corrected TEM
Bert Freitag, Stephan Kujawa, Peter M. Mul, Peter C. Tiemeijer, Etienne Snoeck
Published online by Cambridge University Press:

01 August 2004, pp. 978-979
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The Error of Aberration Measurements in HRTEM Using Zemlin Tableaus
Markus Lentzen, Andreas Thust, Knut Urban
Published online by Cambridge University Press:

01 August 2004, pp. 980-981
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

First Cross-Sectional Observation of Oxygen Atoms at (100) Surfaces of Magnesium Oxide by Cs-Corrected TEM
Nobuo Tanaka, Jun Yamasaki, Tomoyuki Kawai
Published online by Cambridge University Press:

01 August 2004, pp. 982-983
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Residual Crystal Tilt Analysis Using High-Resolution Electron Holography
Michael Lehmann
Published online by Cambridge University Press:

01 August 2004, pp. 984-985
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Double-Biprism Electron Holography and Its Applications
Ken Harada, Yoshihiko Togawa, Tetsuya Akashi, Tsuyoshi Matsuda, Akira Tonomura
Published online by Cambridge University Press:

01 August 2004, pp. 986-987
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 25 of 40

Microscopy and Microanalysis

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Volume 10 - Issue S02 - August 2004

Accessorizing the SEM

Research Article

World Trade Center Particulate Contamination Signature

SE and BSE Information from CNT Containing Fe at Various Accelerating Voltages

The Aberration-corrected SEM - the Ultimate Accessory?

Electron Microscopy of Wet Samples from Cells and Tissues to Food, Cosmetics and Medical Devices

New Ion Beam Milling System for Fast and Efficient Site Specific Sample Preparation

Material Analysis Using SEM/EDS Combined with a Raman Spectrometer

Identification and Quantification of Topologically Close Packed Phases (TCP) in Alloy 22 Using Electron Backscatter Diffraction (EBSD) Analysis

Nanomanipulation of Individual Carbon Nanotubes

Improved Carbon Analysis with Evactron Plasma Cleaning

A Study of the Effects of Evactron® Plasma Cleaning on X-ray Windows

RIMAPS and Variogram Analyses of Microwear Traces in Experiments with Stone Tools

Improvements for HR- and Cryo-SEM by the VCT 100 High-Vacuum Cryo Transfer System and SEM Cooling Stage

Aberration Correction, Electron Holography, High-Resolution TEM

Research Article

Seeing Atoms at Sub-Ångstrom Resolution with Aberration-Corrected TEM

The Weak Phase Object Approximation: From Small Diffraction Angles In Electron Microscopy To Large Angles In Light Optics

Cs Corrector for Imaging

First Experimental Proof of Spatial Resolution Improvement in a Monochromized and Cs-Corrected TEM

The Error of Aberration Measurements in HRTEM Using Zemlin Tableaus

First Cross-Sectional Observation of Oxygen Atoms at (100) Surfaces of Magnesium Oxide by Cs-Corrected TEM

Residual Crystal Tilt Analysis Using High-Resolution Electron Holography

Double-Biprism Electron Holography and Its Applications

Microscopy and Microanalysis

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Volume 10 - Issue S02 - August 2004

Accessorizing the SEM

Research Article

Aberration Correction, Electron Holography, High-Resolution TEM

Research Article