Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-26T04:46:39.565Z Has data issue: false hasContentIssue false
  • English
  • Français

First Experimental Proof of Spatial Resolution Improvement in a Monochromized and Cs-Corrected TEM

Published online by Cambridge University Press:  01 August 2004

Bert Freitag ,
Stephan Kujawa ,
Peter M. Mul ,
Peter C. Tiemeijer  and
Etienne Snoeck
Bert Freitag
Affiliation:
FEI Electron Optics, The Netherlands
Stephan Kujawa
Affiliation:
FEI Electron Optics, The Netherlands
Peter M. Mul
Affiliation:
FEI Electron Optics, The Netherlands
Peter C. Tiemeijer
Affiliation:
FEI Electron Optics, The Netherlands
Etienne Snoeck
Affiliation:
CEMES, France
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 978 - 979
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)